Original title: Povrchová morfologie a-CSi:H vrstev připravených z tetravinylsilanu v nízkoteplotním plazmatu
Translated title: Surface morphology of a-CSi:H films prepared from tetravinylsilane in low-temperature plasma
Authors: Křípalová, Kristýna ; Pálesch, Erik (referee) ; Čech, Vladimír (advisor)
Document type: Bachelor's theses
Year: 2019
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta chemická
Abstract: [cze] [eng]

Keywords: atomic force microscopy (AFM); PECVD; surface morphology; surface roughness; thin films; drsnost povrchu; mikroskopie atomárních sil (AFM); PECVD; povrchová morfologie; tenké vrstvy

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/173405

Permalink: http://www.nusl.cz/ntk/nusl-582371


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2024-04-02, last modified 2024-04-03


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