Original title: Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
Authors: Misiurev, Denis
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
Keywords: AFM; electrochromic materials; SNOM; thin–films
Host item entry: Proceedings I of the 28st Conference STUDENT EEICT 2022: General papers, ISBN 978-80-214-6029-4

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/209375

Permalink: http://www.nusl.cz/ntk/nusl-524802


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Conference materials > Papers