Original title: Ray tracing, aberration coefficients and intensity distribution
Authors: Oral, Martin
Document type: Papers
Conference/Event: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./, Skalský dvůr (CZ), 2010-05-31 / 2010-06-04
Year: 2010
Language: eng
Abstract: In particle optics paraxial ray tracing (solution of the paraxial trajectory equation) provides the basic imaging properties of an optical system and real ray tracing (solution of the equation of motion with time as the parameter) gives the complete particle paths including all aberrations. While there are methods of computing the aberration coefficients directly, for example by evaluating the aberration integrals, ray tracing can also be used for this purpose.
Keywords: aberration coefficients; intensity distribution; ray tracing
Project no.: CEZ:AV0Z20650511 (CEP), IAA100650805 (CEP)
Funding provider: GA AV ČR
Host item entry: Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-254-6842-5

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0190608

Permalink: http://www.nusl.cz/ntk/nusl-41928


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers