Original title: Microcode-Controlled Ram Bist
Authors: Lukáš, Vykydal
Document type: Papers
Language: cze
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.
Keywords: counters; March algorithms; memory BIST; memory testing
Host item entry: Proceedings of the 23st Conference STUDENT EEICT 2017, ISBN 978-80-214-5496-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/187093

Permalink: http://www.nusl.cz/ntk/nusl-414753


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Universities and colleges > Public universities > Brno University of Technology
Conference materials > Papers