Název:
Reduction Of Metal Artefacts In Ct Data With Submicron Resolution Using Dual-Target Ct
Autoři:
Víteček, Jakub ; Šalplachta, Jiří Typ dokumentu: Příspěvky z konference
Jazyk:
eng
Nakladatel: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstrakt:
The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development.
Klíčová slova:
CT images artefacts; Dual-Target CT; Nanotomography; Reduction of metal artefacts; Submicron resolution; X-ray computed tomography Zdrojový dokument: Proceedings of the 25st Conference STUDENT EEICT 2019, ISBN 978-80-214-5735-5
Instituce: Vysoké učení technické v Brně
(web)
Informace o dostupnosti dokumentu:
Plný text je dostupný v Digitální knihovně VUT. Původní záznam: http://hdl.handle.net/11012/186701