Original title: Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer
Authors: Zouhar, Martin ; Radlička, Tomáš ; Oral, Martin ; Konvalina, Ivo
Document type: Papers
Conference/Event: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr (CZ), 20180604
Year: 2018
Language: eng
Abstract: The inelastic mean free path (IMFP) is a key parameter of electron transport in a solid. With\nthe rise of so-called meta-materials, materials of specific shape, such as 2D crystals, or\nmaterials with tailored functionality for next-generation electronic devices, the investigation\nof the IMFP is still topical and of high importance. This is true especially at low energies, landing energy of electrons below 100 eV, that are hard to study using well established\ntechniques of electron spectroscopy.
Keywords: electron microscopy; inelastic mean free path; low energy; time of flight
Project no.: TE01020118 (CEP)
Funding provider: GA TA ČR
Host item entry: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar, ISBN 978-80-87441-23-7

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0287642

Permalink: http://www.nusl.cz/ntk/nusl-387519


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Conference materials > Papers