Original title:
EOD (Electron Optical Design) Program Features
Translated title:
Vlastnosti programu EOD (Electron Optical Design)
Authors:
Lencová, Bohumila ; Zlámal, Jakub Document type: Papers Conference/Event: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./, Skalský dvůr (CZ), 2006-05-22 / 2006-05-26
Year:
2006
Language:
eng Abstract:
[eng][cze] The paper describes the program EOD used in the Institute of Scientific Instruments of AS CR for the design of electron optical devices. New possibilities of the user interface and software are illustrated on suitable examples.Článek popisuje program EOD používaný v ÚPT AV ČR pro návrh elektronově optických zařízení. Nové možnosti uživatelského interfejsu a programu jsou vhodně ilustrovány.
Keywords:
design of electron microscopes; numerical methods of ray tracing; optics of charged particles; the finite element method; user inetrface Project no.: CEZ:AV0Z20650511 (CEP) Host item entry: Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 80-239-6285-X
Institution: Institute of Scientific Instruments AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0139512