Home > Conference materials > Papers > Special measurement methods for specifying of photoluminescence spectra and topograms of semiconductor materials
Original title:
Special measurement methods for specifying of photoluminescence spectra and topograms of semiconductor materials
Authors:
Procházková, M. ; Zavadil, Jiří Document type: Papers Conference/Event: DDECS'95, Rožnov pod Radhoštěm (CZ), 1995-09-19 / 1995-09-21
Year:
1995
Language:
eng Project no.: DDU 0361/93 Funding provider: GA MŠk Host item entry: Proceedings of Seminar Design and Diagnostics of Electronic Circuits and Systems '95 (DDECS'95)
Institution: Institute of Photonics and Electronics AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0113088