guest ::
login
Digital Repository
Search
Submit
Help
About
Home
>
Conference materials
>
Papers
> Characterisation of materials and nanostructures by ballistic electron emission microscopy (BEEM)
Information
Files
Original title:
Characterisation of materials and nanostructures by ballistic electron emission microscopy (BEEM)
Authors:
Walachová, Jarmila
;
Miles, R. J.
;
Collins, D. A.
;
McGill, T. C.
Document type:
Papers
Conference/Event:
NANO'94
, Brno (CZ), 1994-08-29 / 1994-08-30
Year:
1994
Language:
eng
Keywords:
band structure
;
impurity distribution
;
measurement
;
nanostructured materials
;
semiconductor junctions
Project no.:
202/94/1056
Funding provider:
GA ČR
Host item entry:
Nanometrology Scanning Probe Microscopy and Related Techniques
Institution:
Institute of Photonics and Electronics AS ČR (
web
)
Document availability information:
Fulltext is available at the institute of the Academy of Sciences.
Original record:
http://hdl.handle.net/11104/0112946
Permalink:
http://www.nusl.cz/ntk/nusl-32186
The record appears in these collections:
Research
>
Institutes ASCR
>
Institute of Photonics and Electronics
Conference materials
>
Papers
Record created 2011-07-01, last modified 2024-01-26
Similar records
No fulltext
Export as
DC
,
NUŠL
,
RIS
Share