Original title: The possibilities of using FFT for rating the quality of detected signal in ESEM
Authors: Přichystal, Vladimír
Document type: Papers
Conference/Event: CSEM, Vranovská Ves (CZ), 2002-02-08 / 2002-02-09
Year: 2002
Language: eng
Abstract: The main demand for processing of images from scanning electron microscope is acquirement of the best quality of raster image and description of attributes of micrographs and possibility of their comparison with other micrographs. Therefore software was compiled, which serves to numerical calculation of the Fast Fourier Transform (FFT) of micrographs, evaluation and development of their quality.
Keywords: scanning electron microscope
Project no.: GA102/01/1271 (CEP), CEZ:AV0Z2065902 (CEP)
Funding provider: GA ČR
Host item entry: Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society, ISBN 80-238-8749-1

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0101102

Permalink: http://www.nusl.cz/ntk/nusl-29540


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers