Original title: Measurements of Residual Reflectivity and Wavelength of Coated Laser Diodes
Authors: Růžička, Bohdan ; Lazar, Josef ; Wilfert, O.
Document type: Papers
Conference/Event: Radioelektronika 2001 /11./, Brno (CZ), 2001-05-10 / 2001-05-11
Year: 2001
Language: eng
Abstract: This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10 -4 and the repeatibility of the deposition process in a range not exceeding 2x10 -4 .
Keywords: electron beam vacuum evaporation technique
Project no.: CEZ:AV0Z2065902 (CEP), GA101/98/P270 (CEP), IAA2065803 (CEP)
Funding provider: GA ČR, GA AV ČR
Host item entry: 11th International Czech - Slovak Scientific Conference Radioelektronika 2001 Conference Proceedings, ISBN 80-214-1861-3
Note: Související webová stránka: mailto:ruzicka@isibrno.cz

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0101005

Permalink: http://www.nusl.cz/ntk/nusl-29508


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