Original title: Electron sources and beam formation for X-ray microanalysis
Authors: Lencová, Bohumila
Document type: Papers
Conference/Event: EMAS 2000 - Regional Workshop on Electron Probe Microanalysis Today /4./, Třešť (CZ), 2000-05-17 / 2000-05-20
Year: 2000
Language: eng
Abstract: First we discuss the physics of beam formation in electron sources used for electron probe formation and their applicability in microprobe instruments. In the next part magnetic electron lenses in probe forming instruments are described as well as the recent developments in electron optics. Finally we sumarize the relation between the probe dimensions, size and probe current.
Project no.: CEZ:AV0Z2065902 (CEP)
Host item entry: Proceedings EMAS 2000 - 4th Regional Workshop on Electron Probe Microanalysis Today - Practical Aspects, ISBN 80-01-02176-9
Note: Související webová stránka: mailto:bohunka@isibrno.cz

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0100885

Permalink: http://www.nusl.cz/ntk/nusl-29482


The record appears in these collections:
Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers
 Record created 2011-07-01, last modified 2021-11-24


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