Název:
Secondary electron spectroscopy and energy selective imaging for the engineering of carbon based materials
Autoři:
Rodenburg, C. ; Masters, R. ; Lidzey, D. ; Unčovský, M. ; Vystavěl, Tomáš ; Mika, Filip Typ dokumentu: Příspěvky z konference Konference/Akce: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./, Skalský dvůr (CZ), 20160529
Rok:
2016
Jazyk:
eng
Abstrakt: That the fine structure of secondary electron emission spectra (SES) from carbon fibres is effected by fibre crystallinity and molecular orientation and linked to engineering materials properties such as modulus was reported over three decades ago. In spite of this\nlongstanding knowledge SES are not yet widely exploited for materials engineering of carbon based materials, probably due to a lack of instrumentation that is suitable to collect SES from beam sensitive materials and also has the capability to visualise, local variation based on SES shape. Thanks to rapid advances in low voltage SEM that offer energy selective imaging, it was recently demonstrated that differences in SES for different carbon based materials can be used to map chemical variations with sub-nanometer resolution when only SE 8 < eV were\nselected to form the SEM images. Such high resolution is not surprising as the implementation of energy filtering in SEMs to improve image resolutions was previously advocated. To fully exploit energy selective imaging for materials engineering the nature of the features in the SES must be determined.
Klíčová slova:
emission spectroscopy; SES Zdrojový dokument: Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-87441-17-6 Poznámka: Související webová stránka: http://www.trends.isibrno.cz/
Instituce: Ústav přístrojové techniky AV ČR
(web)
Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0260344