Original title: Měření dynamických vlastností bipolárních tranzistorů
Translated title: Basic measurement of dynamic properties of bipolar transistors
Authors: Repčík, Juraj ; Šteffan, Pavel (referee) ; Dřínovský, Jiří (advisor)
Document type: Bachelor's theses
Year: 2015
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Abstract: [cze] [eng]

Keywords: bipolar; dynamic properties; LabVIEW; operating point; transistor; bipolárny; dynamické vlastnosti; LabVIEW; pracovný bod; tranzistor

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/40816

Permalink: http://www.nusl.cz/ntk/nusl-244592


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Bachelor's theses
 Record created 2016-06-03, last modified 2022-09-04


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