Original title: The first experience with the specimen preparation for low-voltage transmission electron microscope
Authors: Nebesářová, Jana ; Vancová, Marie
Document type: Papers
Conference/Event: Annual Meeting of the Czechoslovak Microscopy Society /2./, Vranovská ves (CZ), 2002-02-08 / 2002-02-09
Year: 2002
Language: eng
Abstract: The low-voltage transmission electron microscope, working in the TEM mode, requires ultrathin sections with a thickness 20-30nm. This demand brings problems with a section cohesion caused by insufficient resin infiltration and with a chatter caused by unequal thickness of the section. The contrast of unstained biological specimens in LV TEM is comparable with the contrast obtained in HV TEM of stained specimens.
Keywords: low-voltage transmission electron microscopy; specimen preparation
Project no.: CEZ:AV0Z6022909 (CEP)
Host item entry: Microscopy 2002. Proceedings of the 2nd (re-established) Annual Meeting of the Czechoslovak Microscopy Society, held on February 8 to 9, 2002 in Hotel Club, Vranovská ves near Znojmo, ISBN 80-238-8749-1

Institution: Institute of Parasitology AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0055033

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