Original title: Current Fluctuations of Reverse-Biased Solar
Authors: Škvarenina, Ľ.
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: This paper presents mainly noise diagnostics of pn junctions local defects in a singlecrystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.
Keywords: Defects; Diagnostics; Flicker Noise; Noise Spectroscopy; Silicon; Solar Cells
Host item entry: Proceedings of the 21st Conference STUDENT EEICT 2015, ISBN 978-80-214-5148-3

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/43060

Permalink: http://www.nusl.cz/ntk/nusl-220489


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Universities and colleges > Public universities > Brno University of Technology
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