Original title:
Electron probe microanalysis of nonconductive bulk samples
Authors:
Jurek, Karel ; Gedeon, O. Document type: Papers Conference/Event: EMAS /4./, Třešť (CZ), 2000-05-17 / 2000-05-20
Year:
2000
Language:
eng Abstract:
Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling.
Keywords:
electric charging; electron probe; x-ray microanalysis Project no.: CEZ:AV0Z1010914 (CEP) Host item entry: Electron probe microanalysis today practical aspects, ISBN 80-01-02176-9
Institution: Institute of Physics AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0031432