Original title: Lifetime on carriers and seebeck coefficient in semiconductors
Translated title: Doba života nosičů náboje a Seebeckův koeficient v polovodičích
Authors: Vacková, S. ; Gorodynskyy, Vladyslav ; Žďánský, Karel ; Vacek, K. ; Kozak, Halina
Document type: Papers
Conference/Event: Workshop 2004, Praha (CZ), 2004-03-22 / 2004-03-26
Year: 2004
Language: eng
Abstract: [eng] [cze]
The lifetime of carriers represents an important parameter of radiation detectors which is characteristic for them. Usually the current experimental technique for their measurement makes use of different experimental methods, as photoconductivity. Very often the product of mobility and lifetime is introduced as a criterion for the semiconductor suitability of radiation detection. Doba života nosičů náboje je důležitým parametrem radiačních detektorů, která je pro ně charakteristická. Mezi různé metodiky měření této veličiny patří obyčejně používaná metodika měření fotovodivosti. Součin pohyblivosti a doby života je známý jako kritérium vhodnosti polovodičů pro detektory záření.
Keywords: carrier lifetime; photoconductivity; Seebeck effect
Project no.: IBS2067354 (CEP), KSK1010104 (CEP)
Funding provider: GA AV ČR, GA AV ČR
Host item entry: Proceedings of WORKSHOP 2004, ISBN 80-01-02945-X

Institution: Institute of Photonics and Electronics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0013144

Permalink: http://www.nusl.cz/ntk/nusl-19987


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Research > Institutes ASCR > Institute of Photonics and Electronics
Conference materials > Papers