Original title: Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
Authors: Ligas, A. ; Hida, S. ; Matsuda, K. ; Mikmeková, Šárka
Document type: Papers
Conference/Event: International Microscopy Congres /18./, Praha (CZ), 2014-09-07 / 2014-09-12
Year: 2014
Language: eng
Abstract: Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM detector in the SEM operated in the CL mode.
Keywords: SLEEM; STLEEM
Project no.: TE01020118 (CEP)
Funding provider: GA TA ČR
Host item entry: 18th International Microscopy Congres. Proceedings, ISBN 978-80-260-6720-7

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0238246

Permalink: http://www.nusl.cz/ntk/nusl-177532


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