Original title: The optical spectra of carbon-based thin films measured by the photothermal deflection spectroscopy (PDS)
Authors: Remeš, Zdeněk ; Pham, T.T. ; Varga, Marián ; Kromka, Alexander ; Stuchlík, Jiří ; Mao, H.B.
Document type: Papers
Conference/Event: International Conference NANOCON 2013 /5./, Brno (CZ), 2013-10-16 / 2013-10-18
Year: 2014
Language: eng
Abstract: Our photothermal deflection spectroscopy (PDS) setup allows to measure simultaneously the absolute values of the optical transmittance T, reflectance R and absorptance A spectra of thin layers on glass substrates in the spectral range from ultraviolet to near infrared light with the typical spectral resolution 5 nm in the ultraviolet, 10 nm in visible and 20 nm in the near infrared region. The PDS setup provides the dynamic detection range in the optical absorptance up to 4 orders of magnitude. Here we demonstrate the usability of this setup by comparing the optical absorbance on a series of the carbon layer and nanocrystalline diamond (NCD) thin layers deposited on glass substrates by using the magnetron sputtering and the microwave based surface wave discharge in linear antenna chemical vapor deposition (CVD) processes, respectively. The defect-induced localized states in the energy gap are observed in all carbon layers as well as in NCD.
Keywords: nanodiamond; PDS; thin films
Project no.: LH12236 (CEP), LH12186 (CEP)
Funding provider: GA MŠk, GA MŠk
Host item entry: NANOCON 2013 - 5th International Conference Proceedings, ISBN 978-80-87294-47-5

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0231038

Permalink: http://www.nusl.cz/ntk/nusl-170458


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