Original title: Accuracy of internal and external standard method in quantitative analysis by X-ray powder diffraction
Authors: Pérez-Estébanez, Marta ; Viani, Alberto
Document type: Research reports
Year: 2013
Language: eng
Abstract: The X-ray powder diffraction method is known to convey information on the phase composition of samples. Obtaining an accurate quantification of these phases has been long precluded. With the advent of the Rietveld method [1] this became possible. Hedemonstrated the possibility to extract accurate structural information from neutron powder diffraction data. Later, his approach has been extended to x-ray powder diffraction data with successful results. The basics of the Rietveld method lays on the complete exploitation of the whole powder profile without extracting the integrated intensities. The structural information are obtained by fitting the entire profile of the measured diffraction pattern to a calculated diffraction profile. The refinement procedure implements the least square regression and it requires a reasonable scheme of starting values that approximate the real datum.
Keywords: Rietveld method; standard method; X-ray powder diffraction
Project no.: ED1.1.00/02.0060
Funding provider: GA MŠk

Institution: Institute of Theoretical and Applied Mechanics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0230158

Permalink: http://www.nusl.cz/ntk/nusl-170270


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