Original title: Fast simulation of ToF spectrometers
Authors: Oral, Martin
Document type: Papers
Conference/Event: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr (CZ), 2012-06-25 / 2012-06-29
Year: 2012
Language: eng
Abstract: A fast simulation method was developed for analysis of time-of-flight spectrometers and it has been successfully used to optimize parameters of a real instrument. In the general case, the function of a time-of-flight spectrometer is best modeled using the Monte Carlo method, That involves calculation of a high number of ion trajectories, which is time consuming. We have found a way to reduce the calculation time greatly by introducing a simplification and using pre-computed data independent on the ion mass and charge. The procedure makes it computationally feasible to run iterative optimizations. By comparing the results with those of a realistic simulation on a selected case, we have verified that there is no noticeable influence on the results.
Keywords: fast simulation method; ToF SIMS
Project no.: ED0017/01/01
Funding provider: GA MŠk
Host item entry: Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-87441-07-7

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0215695

Permalink: http://www.nusl.cz/ntk/nusl-135999


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Research > Institutes ASCR > Institute of Scientific Instruments
Conference materials > Papers