Original title: Microscopy of nanoparticles and films with nanoparticles
Authors: Kacerovský, Pavel ; Žďánský, Karel ; Procházková, Olga ; Vaniš, Jan ; Grym, Jan ; Vasiliev, A. ; Pašajev, E. M.
Document type: Papers
Conference/Event: Stucture 2009, Colloquium Czech and Slovak Crystallographic Assosiation, Hluboká nad Vltavou (CZ), 2009-06-22 / 2009-06-25
Year: 2009
Language: eng
Abstract: To study the electrophoreticaly deposited nanolayers of reverse micelles with Pd nano-particles on n-type InP substrates a wide range of current microscopic methods has been used. What concerns analytical methods the X-ray diffraction and mass spectrometry SIMS were used. The most relevant results about Pd nanoparticles in the layer were obtained by using HRTEM microscopy and SIMS spectrometry. In nanolayers crystallographic arrangement of Pd nanoparticles has not been found.
Keywords: nanostructures; semiconductor devices
Project no.: CEZ:AV0Z20670512 (CEP), GA102/09/1037 (CEP), KAN401220801 (CEP)
Funding provider: GA ČR, GA AV ČR
Host item entry: Materials Structure in Chemistry, Biology, Physics and Technology, ISSN 1211-5894

Institution: Institute of Photonics and Electronics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0187284

Permalink: http://www.nusl.cz/ntk/nusl-41620


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Research > Institutes ASCR > Institute of Photonics and Electronics
Conference materials > Papers