Název: Very low energy electron transmission spectromicroscopy
Autoři: Daniel, Benjamin ; Radlička, Tomáš ; Piňos, Jakub ; Mikmeková, Šárka ; Konvalina, Ivo ; Frank, Luděk ; Müllerová, Ilona
Typ dokumentu: Příspěvky z konference
Konference/Akce: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský dvůr (CZ), 20180604
Rok: 2018
Jazyk: eng
Abstrakt: For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the Institute of Scientific Instruments (ISI), with several commercially available SEMs adapted with a cathode lens for SLEEM use, as well as a dedicated self-built UHVSLEEM setup.\nFor a better understanding of contrast formation at low energies, especially at very low energies below 50 eV, where the local density of states plays an important role, more general knowledge about the interaction of (very) low energy electrons with solids is required. This will be achieved using a newly developed ultra-high vacuum (UHV SLEEM) setup which includes several enhancements compared to other available machines. Data processing is presented in, and processed data will be further used and tested with the Monte Carlosimulation package BRUCE, which is being developed by Werner et al. at TU Vienna.
Klíčová slova: electron energy lost spectroscopy; electron microscopy; low energy scanning electron microscopy; time of flight
Číslo projektu: 606988
Zdrojový dokument: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar, ISBN 978-80-87441-23-7

Instituce: Ústav přístrojové techniky AV ČR (web)
Informace o dostupnosti dokumentu: Dokument je dostupný v příslušném ústavu Akademie věd ČR.
Původní záznam: http://hdl.handle.net/11104/0287590

Trvalý odkaz NUŠL: http://www.nusl.cz/ntk/nusl-387499


Záznam je zařazen do těchto sbírek:
Věda a výzkum > AV ČR > Ústav přístrojové techniky
Konferenční materiály > Příspěvky z konference