Original title: Determination of Roughness Factor and Fractal Dimension of Zirconium in its Native and Surface Modified State using Atomic Force Microscopy. Effect of the Hydrogen Evolution Reaction on the Surface Structure
Authors: Novák, M. ; Kocábová, Jana ; Kolivoška, Viliam ; Pospíšil, Lubomír ; Macák, J. ; Cichoň, Stanislav ; Cháb, Vladimír ; Hromadová, Magdaléna
Document type: Papers
Conference/Event: Moderní elektrochemické metody /38./, Jetřichovice (CZ), 20180521
Year: 2018
Language: eng
Abstract: Atomic force microscopy (AFM) was used to characterize surface morphology of pristine zirconium, Si modified and FeSi modified zirconium electrodes prior and after hydrogen evolution at potentials negative of the open circuit potential value. Two main characteristic parameters were obtained from the ex situ AFM height images, namely, the roughness factor and fractal dimension of the studied surface. The effect of hydrogen evolution reaction on the electrode surface morphology was discussed. Fractal dimension values were used successfully to explain the non ideality of the interfacial capacitance.
Keywords: atomic force microscopy; fractal dimension; zirconium electrode
Project no.: GA16-03085S (CEP)
Funding provider: GA ČR
Host item entry: XXXVIII. Moderní elektrochemické metody. Sborník přednášek, ISBN 978-80-905221-6-9

Institution: J. Heyrovsky Institute of Physical Chemistry AS ČR (web)
Document availability information: Fulltext is available on demand via the digital repository of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0284341

Permalink: http://www.nusl.cz/ntk/nusl-375656


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Research > Institutes ASCR > J. Heyrovsky Institute of Physical Chemistry
Conference materials > Papers