Název: Ion beams provided by small accelerators for material synthesis and characterization
Autoři: Macková, Anna ; Havránek, Vladimír
Typ dokumentu: Příspěvky z konference
Konference/Akce: Carpathian Summer School of Physics 2016, Sinaia (RO), 20160626
Rok: 2017
Jazyk: eng
Abstrakt: The compact, multipurpose electrostatic tandem accelerators are extensively used for production of ion beams with energies in the range from 400 keV to 24 MeV of almost all elements of the periodic system for the trace element analysis by means of nuclear analytical methods. The ion beams produced by small accelerators have a broad application, mainly for material characterization (Rutherford Back-Scattering spectrometry, Particle Induced X ray Emission analysis, Nuclear Reaction Analysis and Ion-Microprobe with 1 um lateral resolution among others) and for high-energy implantation. Material research belongs to traditionally progressive fields of technology. Due to the continuous miniaturization, the underlying structures are far beyond the analytical limits of the most conventional methods. Ion Beam Analysis (IBA) techniques provide this possibility as they use probes of similar or much smaller dimensions (particles, radiation). Ion beams can be used for the synthesis of new progressive functional nanomaterials for optics, electronics and other applications. Ion beams are extensively used in studies of the fundamental energetic ion interaction with matter as well as in the novel nanostructure synthesis using ion beam irradiation in various amorphous and crystalline materials in order to get structures with extraordinary functional properties. IBA methods serve for investigation of materials coming from material research, industry, micro- and nano-technology, electronics, optics and laser technology, chemical, biological and environmental investigation in general. Main research directions in laboratories employing small accelerators are also the preparation and characterization of micro- and nano-structured materials which are of interest for basic and oriented research in material science, and various studies of biological, geological, environmental and cultural heritage artefacts are provided too.
Klíčová slova: Electronics; Electrostatic accelerators; Ion beams; Nanostructures; Optics and optical physics
Číslo projektu: LM2015056 (CEP), GA15-01602S (CEP)
Poskytovatel projektu: GA MŠk, GA ČR
Zdrojový dokument: AIP Conference Proceedings, ISBN 978-0-7354-1526-3

Instituce: Ústav jaderné fyziky AV ČR (web)
Informace o dostupnosti dokumentu: Dokument je dostupný v příslušném ústavu Akademie věd ČR.
Původní záznam: http://hdl.handle.net/11104/0276375

Trvalý odkaz NUŠL: http://www.nusl.cz/ntk/nusl-373292


Záznam je zařazen do těchto sbírek:
Věda a výzkum > AV ČR > Ústav jaderné fyziky
Konferenční materiály > Příspěvky z konference