Original title: Surface examination of ultra-sharp cold field-emission cathode
Authors: Knápek, A. ; Brüstlová, J. ; Trčka, T. ; Klampár, M. ; Mikmeková, Šárka
Document type: Papers
Conference/Event: New Trends in Physics 2012, Brno (CZ), 2012-10-11 / 2012-10-12
Year: 2012
Language: eng
Abstract: An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.
Keywords: DRS; SLEEM; ultra-sharp field-emission cathode
Host item entry: New Trends in Physics 2012. Proceedings of the conference, ISBN 978-80-214-4594-9

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0215513

Permalink: http://www.nusl.cz/ntk/nusl-135542


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