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Relation between optical and microscopic properties of hydrogenated silicon thin films with integrated germanium and tin nanoparticles
 Stuchlík, Jiří ; Stuchlíková, The-Ha ; Čermák, Jan ; Kupčík, Jaroslav ; Fajgar, Radek ; Remeš, Zdeněk
The hydrogenated amorphous silicon layers (a-Si:H) were deposited by PECVD method on quartz substrates. During interruption of PECVD process the vacuum chamber was pumped up to 10-5 Pa and 1 nm thin films of Germanium or Tin were evaporated on the surface. The materials form isolated nanoparticles (NPs) on the a-Si:H surface. Then the deposited NPs were covered and stabilized by a-Si:H layer by PECVD. Those two deposition processes were alternated 5 times. The a-Si:H thin films with integrated Ge or Sn NPs were characterized optically by PDS and CPM methods, and microscopically by SEM and AFM microscopies. Optical and microscopic properties of the structures are correlated and discussed considering their application in photovoltaics.\n
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