National Repository of Grey Literature 8 records found  Search took 0.00 seconds. 
SRAM memories testing with utilization of memory built-in-self-test
Sedlář, Jan ; Fujcik, Lukáš (referee) ; Hejátková, Edita (advisor)
The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofware tool Tessent Memory BIST. The main purpose is to get familiar with memory testing and to create a design for testing on a specific chip which after its implementation on the chip will retain the original features and functions. Subsequently, the tool is evaluated on its usability.
RAM-Tester Design in VHDL
Charvát, Jiří ; Straka, Martin (referee) ; Strnadel, Josef (advisor)
This paper describes various approaches to hardware testing semiconductor memory. We describe the priciple of basic memory types, the way which each of them stores information and their comunication protocol. Following part deals with common failures which may occur in the memory.  The section also describes the implementation of memory model and tester designed in VHDL language. It is possible to inject some errors into memory, which are later detected by the tester. The final section shows the response of tester to various error types according to used error detection method. The paper is especially focused on failure detection by variants of march test.
Generator of Physically Unclonable Function
Koleček, František ; Bidlo, Michal (referee) ; Strnadel, Josef (advisor)
This thesis covers the topic of physically unclonable functions. In the research part of this theses there is information about basic principles of the topic as well as classification and description of different types of physically unclonable functions. There is also information about the practical use of physically unclonable functions. The practical part of this theses covers the implementation of my own version of physically unclonable function that uses after-reset SRAM memory contents as physical fingerprint. The parameters of this function are promising. The inner and intra distances do not overlap.
Digital I/O card with USB communication
Kořínek, Milan ; Holek, Radovan (referee) ; Macho, Tomáš (advisor)
The thesis deals with the design of digital I/O card with USB connectivity for Honeywell spol. s r.o. – HTS CZ o.z. company. The main objective is the delay elimination between reading the current state of the inputs and outputs setting which occurs on the actual used commercial card. Further initial analysis outlines possible solutions at the beginning of the work. One of chapters describes USB communication interface, including its com- munications protocol and USB driver implementation on the operating system Microsoft Windows. The digital card has four I/O ports consisting of eight lines. All ports have built-in protection against overcurrent and ESD protection. Digital isolator is used for USB. Power is supplied via USB, but it is optionally possible to connect an external power source. The last part of the thesis is focused on the card driver design.
Generator of Physically Unclonable Function
Koleček, František ; Bidlo, Michal (referee) ; Strnadel, Josef (advisor)
This thesis covers the topic of physically unclonable functions. In the research part of this theses there is information about basic principles of the topic as well as classification and description of different types of physically unclonable functions. There is also information about the practical use of physically unclonable functions. The practical part of this theses covers the implementation of my own version of physically unclonable function that uses after-reset SRAM memory contents as physical fingerprint. The parameters of this function are promising. The inner and intra distances do not overlap.
SRAM memories testing with utilization of memory built-in-self-test
Sedlář, Jan ; Fujcik, Lukáš (referee) ; Hejátková, Edita (advisor)
The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofware tool Tessent Memory BIST. The main purpose is to get familiar with memory testing and to create a design for testing on a specific chip which after its implementation on the chip will retain the original features and functions. Subsequently, the tool is evaluated on its usability.
RAM-Tester Design in VHDL
Charvát, Jiří ; Straka, Martin (referee) ; Strnadel, Josef (advisor)
This paper describes various approaches to hardware testing semiconductor memory. We describe the priciple of basic memory types, the way which each of them stores information and their comunication protocol. Following part deals with common failures which may occur in the memory.  The section also describes the implementation of memory model and tester designed in VHDL language. It is possible to inject some errors into memory, which are later detected by the tester. The final section shows the response of tester to various error types according to used error detection method. The paper is especially focused on failure detection by variants of march test.
Digital I/O card with USB communication
Kořínek, Milan ; Holek, Radovan (referee) ; Macho, Tomáš (advisor)
The thesis deals with the design of digital I/O card with USB connectivity for Honeywell spol. s r.o. – HTS CZ o.z. company. The main objective is the delay elimination between reading the current state of the inputs and outputs setting which occurs on the actual used commercial card. Further initial analysis outlines possible solutions at the beginning of the work. One of chapters describes USB communication interface, including its com- munications protocol and USB driver implementation on the operating system Microsoft Windows. The digital card has four I/O ports consisting of eight lines. All ports have built-in protection against overcurrent and ESD protection. Digital isolator is used for USB. Power is supplied via USB, but it is optionally possible to connect an external power source. The last part of the thesis is focused on the card driver design.

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