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Study of the optical properties of titanium dioxide thin films
Rackovská, Anna Patrícia ; Schmiedová, Veronika (referee) ; Zmeškal, Oldřich (advisor)
The bachelor thesis is focused on the acquirement of thin film layers optical properties characterisation methods, done on inject printed titanium dioxide layers deposed on soda lime glass. Its main emphasis was on spectroscopic ellipsometry that was used to determine the refractive indices and the extinction coefficients of the samples in range of wavelengths from 200 nm to 850 nm and layer thickness. This thesis also shows another options of thin film layers preparation and several other methods to characterise properties of samples, specifically optical microscopy, used to set sample boundary as rough, mechanical profilometry which defined thickness of layers in range of 80 nm for the most thin sample to 250 nm for the most thick sample, and UV-VIS spectroscopy.
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Study of optical properties of thin films of perovskite MAPbBr3 precursors
Rackovská, Anna Patrícia ; Schmiedová, Veronika (referee) ; Zmeškal, Oldřich (advisor)
This diploma thesis is focused on preparation of perovskite methylammonium lead bromide thin film layers and also thin film layers of its precursors, namely methylammonium bromide and lead(II) bromide, by spin-coating from the solution; and optical characterisation of the prepared thin film layers by UV-VIS spectroscopy and spectroscopical ellipsometry. Methylammonium bromide does not absorb in visible nor ultraviolet region, the maximum absorption of lead(II) bromide occurred in ultraviolet region, methylammonium lead bromide absorbs in visible region. Optical band gaps were determined by Tauc method to (3,5 ± 0,1) eV for lead(II) bromide and 2,15 eV, respectively 2,25 eV for perovskite. Refractive indices and extinction coefficients were determined by ellipsometry in range of wavelengths from 290 nm to 830 nm and their dependence with layer thickness was discussed. Ellipsometry model used in this thesis consist on Tauc-Lorentz oscillators for methylammonium bromide, methylammonium lead bromide and partially for lead(II) bromide, which another part is formed by New Amorphous oscillator.
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Study of Optical Properties and Interference Phenomena on Thin Films of Organic Mcaterials
Schmiedová, Veronika ; Čeppan, Michal (referee) ; Mistrík, Jan (referee) ; Zmeškal, Oldřich (advisor)
Ph.D. thesis is focused on the study and determination of layer thickness and optical properties, such as the dispersion dependence of the refractive index of various materials prepared in the form of thin layer. In the first part of this work the theoretical findings in the field of spectroscopic ellipsometry are summarised. These findings are followed by the description and characterization of the light polarization, evaluation of experimental data and determination of the physical properties of studied materials. Experimental and result section of this work is devoted to the preparation and characterization of thin films of the studied materials: titanum dioxide (TiO2), new organic materials (MDMO-PPV, PCDTBT, PCBTDPP, PC60BM, PC70BM) and reduced graphene oxide (rGO). These were all selected with respect to their potential use in the organic photovoltaics.
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Study of organic materials thin film homogenity
Lacinová, Eva ; Vala, Martin (referee) ; Zmeškal, Oldřich (advisor)
This thesis deals with study homogeneity of thin organic layers using image analysis. The theoretical parts deal with preparation thin layers and some methods examining their surface, especially optical microscopy and profilometry. Optical microscope NIKON ECLIPSE E200, digital camera NIKON 5400 and computer was used for study homogeneity of organic layers by image analysis. Images of the organic layer and single electrodes, which were steamed on organic layer, were surveyed. Homogeneity of surfaces layers was assessed by errors related with common moments (roughness average, root mean square roughness, skewness, and kurtosis). Differences between single samples in connection with size their common moments and homogeneity are discussed at the close of this work.
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Study of optical properties of thin films of perovskite MAPbBr3 precursors
Rackovská, Anna Patrícia ; Schmiedová, Veronika (referee) ; Zmeškal, Oldřich (advisor)
This diploma thesis is focused on preparation of perovskite methylammonium lead bromide thin film layers and also thin film layers of its precursors, namely methylammonium bromide and lead(II) bromide, by spin-coating from the solution; and optical characterisation of the prepared thin film layers by UV-VIS spectroscopy and spectroscopical ellipsometry. Methylammonium bromide does not absorb in visible nor ultraviolet region, the maximum absorption of lead(II) bromide occurred in ultraviolet region, methylammonium lead bromide absorbs in visible region. Optical band gaps were determined by Tauc method to (3,5 ± 0,1) eV for lead(II) bromide and 2,15 eV, respectively 2,25 eV for perovskite. Refractive indices and extinction coefficients were determined by ellipsometry in range of wavelengths from 290 nm to 830 nm and their dependence with layer thickness was discussed. Ellipsometry model used in this thesis consist on Tauc-Lorentz oscillators for methylammonium bromide, methylammonium lead bromide and partially for lead(II) bromide, which another part is formed by New Amorphous oscillator.
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Study of the optical properties of titanium dioxide thin films
Rackovská, Anna Patrícia ; Schmiedová, Veronika (referee) ; Zmeškal, Oldřich (advisor)
The bachelor thesis is focused on the acquirement of thin film layers optical properties characterisation methods, done on inject printed titanium dioxide layers deposed on soda lime glass. Its main emphasis was on spectroscopic ellipsometry that was used to determine the refractive indices and the extinction coefficients of the samples in range of wavelengths from 200 nm to 850 nm and layer thickness. This thesis also shows another options of thin film layers preparation and several other methods to characterise properties of samples, specifically optical microscopy, used to set sample boundary as rough, mechanical profilometry which defined thickness of layers in range of 80 nm for the most thin sample to 250 nm for the most thick sample, and UV-VIS spectroscopy.
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Study of Optical Properties and Interference Phenomena on Thin Films of Organic Mcaterials
Schmiedová, Veronika ; Čeppan, Michal (referee) ; Mistrík, Jan (referee) ; Zmeškal, Oldřich (advisor)
Ph.D. thesis is focused on the study and determination of layer thickness and optical properties, such as the dispersion dependence of the refractive index of various materials prepared in the form of thin layer. In the first part of this work the theoretical findings in the field of spectroscopic ellipsometry are summarised. These findings are followed by the description and characterization of the light polarization, evaluation of experimental data and determination of the physical properties of studied materials. Experimental and result section of this work is devoted to the preparation and characterization of thin films of the studied materials: titanum dioxide (TiO2), new organic materials (MDMO-PPV, PCDTBT, PCBTDPP, PC60BM, PC70BM) and reduced graphene oxide (rGO). These were all selected with respect to their potential use in the organic photovoltaics.
|
|
|
Study of organic materials thin film homogenity
Lacinová, Eva ; Vala, Martin (referee) ; Zmeškal, Oldřich (advisor)
This thesis deals with study homogeneity of thin organic layers using image analysis. The theoretical parts deal with preparation thin layers and some methods examining their surface, especially optical microscopy and profilometry. Optical microscope NIKON ECLIPSE E200, digital camera NIKON 5400 and computer was used for study homogeneity of organic layers by image analysis. Images of the organic layer and single electrodes, which were steamed on organic layer, were surveyed. Homogeneity of surfaces layers was assessed by errors related with common moments (roughness average, root mean square roughness, skewness, and kurtosis). Differences between single samples in connection with size their common moments and homogeneity are discussed at the close of this work.
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