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Study of the optical properties of titanium dioxide thin films
Rackovská, Anna Patrícia ; Schmiedová, Veronika (oponent) ; Zmeškal, Oldřich (vedoucí práce)
The bachelor thesis is focused on the acquirement of thin film layers optical properties characterisation methods, done on inject printed titanium dioxide layers deposed on soda lime glass. Its main emphasis was on spectroscopic ellipsometry that was used to determine the refractive indices and the extinction coefficients of the samples in range of wavelengths from 200 nm to 850 nm and layer thickness. This thesis also shows another options of thin film layers preparation and several other methods to characterise properties of samples, specifically optical microscopy, used to set sample boundary as rough, mechanical profilometry which defined thickness of layers in range of 80 nm for the most thin sample to 250 nm for the most thick sample, and UV-VIS spectroscopy.
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Study of optical properties of thin films of perovskite MAPbBr3 precursors
Rackovská, Anna Patrícia ; Schmiedová, Veronika (oponent) ; Zmeškal, Oldřich (vedoucí práce)
This diploma thesis is focused on preparation of perovskite methylammonium lead bromide thin film layers and also thin film layers of its precursors, namely methylammonium bromide and lead(II) bromide, by spin-coating from the solution; and optical characterisation of the prepared thin film layers by UV-VIS spectroscopy and spectroscopical ellipsometry. Methylammonium bromide does not absorb in visible nor ultraviolet region, the maximum absorption of lead(II) bromide occurred in ultraviolet region, methylammonium lead bromide absorbs in visible region. Optical band gaps were determined by Tauc method to (3,5 ± 0,1) eV for lead(II) bromide and 2,15 eV, respectively 2,25 eV for perovskite. Refractive indices and extinction coefficients were determined by ellipsometry in range of wavelengths from 290 nm to 830 nm and their dependence with layer thickness was discussed. Ellipsometry model used in this thesis consist on Tauc-Lorentz oscillators for methylammonium bromide, methylammonium lead bromide and partially for lead(II) bromide, which another part is formed by New Amorphous oscillator.
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Study of optical properties of thin films of perovskite MAPbBr3 precursors
Rackovská, Anna Patrícia ; Schmiedová, Veronika (oponent) ; Zmeškal, Oldřich (vedoucí práce)
This diploma thesis is focused on preparation of perovskite methylammonium lead bromide thin film layers and also thin film layers of its precursors, namely methylammonium bromide and lead(II) bromide, by spin-coating from the solution; and optical characterisation of the prepared thin film layers by UV-VIS spectroscopy and spectroscopical ellipsometry. Methylammonium bromide does not absorb in visible nor ultraviolet region, the maximum absorption of lead(II) bromide occurred in ultraviolet region, methylammonium lead bromide absorbs in visible region. Optical band gaps were determined by Tauc method to (3,5 ± 0,1) eV for lead(II) bromide and 2,15 eV, respectively 2,25 eV for perovskite. Refractive indices and extinction coefficients were determined by ellipsometry in range of wavelengths from 290 nm to 830 nm and their dependence with layer thickness was discussed. Ellipsometry model used in this thesis consist on Tauc-Lorentz oscillators for methylammonium bromide, methylammonium lead bromide and partially for lead(II) bromide, which another part is formed by New Amorphous oscillator.
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Study of the optical properties of titanium dioxide thin films
Rackovská, Anna Patrícia ; Schmiedová, Veronika (oponent) ; Zmeškal, Oldřich (vedoucí práce)
The bachelor thesis is focused on the acquirement of thin film layers optical properties characterisation methods, done on inject printed titanium dioxide layers deposed on soda lime glass. Its main emphasis was on spectroscopic ellipsometry that was used to determine the refractive indices and the extinction coefficients of the samples in range of wavelengths from 200 nm to 850 nm and layer thickness. This thesis also shows another options of thin film layers preparation and several other methods to characterise properties of samples, specifically optical microscopy, used to set sample boundary as rough, mechanical profilometry which defined thickness of layers in range of 80 nm for the most thin sample to 250 nm for the most thick sample, and UV-VIS spectroscopy.
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