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Thin films prepared in RF glow discharge and their physico-chemical properties
Bránecký, Martin ; Boušek, Jaroslav (referee) ; Čech, Vladimír (advisor)
Theoretical part of this master thesis was focused on literature recherché dealing with the formation of thin films, plasma, plasma analyses using mass spectrometry and plasma polymerization. Further, this section describes the analysis of thin films using optical methods such as spectroscopic ellipsometry and FT-IR spectrometry. Experimental part describes the materials which are used for the preparation of thin films as well as a description of the equipment for preparation of thin films using a technology of plasma-enhanced chemical vapor deposition (PE-CVD). Control of deposition conditions and monitoring of plasma with its products result in high reproducibility of thin films. The last part of the thesis describes the results of measurement of the first group of samples and their ellipsometric, mass spectrometry and FT-IR evaluation with respect to the deposition conditions.
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Characterization of a new deposition system for coating the fibers
Zvonek, Milan ; Salyk, Ota (referee) ; Čech, Vladimír (advisor)
Cieľom bakalárskej práce je charakterizácia depozičného systému na výrobu tenkých vrstiev. Teoretická časť je zameraná na literárnu rešerš o plazme, plazmovej polymerácií, tenkých vrstvách a ich analýzu pomocou infračervenej spektroskopie a spektroskopickej elipsometrie. Experimentálna časť popisuje použité materiály a aparaturu použitú na prípravu tenkých vrstiev pomocou plazmovej polymerácie. Posledná časť popisuje výsledky merania depozícií tenkých vrstiev a ich vyhodnotenie vzhľadom na depozičné podmienky.
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Optical and magneto-optical properties of thin films of topological insulator Bi2Se3
Jambrich, Jakub ; Veis, Martin (advisor) ; Hamrle, Jaroslav (referee)
Topological insulators have attracted intensive research interest in the field of material research in the last two decades. Their main advantage is that metallic conductive states are formed on their surface, in which the electrons can move as if their effective mass is nearly zero. This feature has huge potential for use in the new generation of high-speed electronics. In this work, we investigate the optical and magneto-optical properties of the topological insulator Bi2Se3, which are key to its further potential use. By measuring the absorption at Landau levels in a high magnetic field, we determine the shape of the dispersion of the electronic structure as well as the bandgap. Subsequently, by spectroscopic ellipsometry in the range of the visible and near-ultraviolet spectrum, we measure the energy dependence of complex relative permittivity, which is the key for the description of optical properties.
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Dynamic change in optical response of nanostructures
Vančík, Michal ; Veis, Martin (advisor) ; Zázvorka, Jakub (referee)
Title: Dynamic change in optical response of nanostructures Author: Michal Vančík Institute: Institute of Physics of Charles University Supervisor: RNDr. Martin Veis, Ph.D., Institute of Physics of Charles University Abstract: At the present time, properties of thin layers and multilayered nanos- tructures are intensively reseacrched. Because of different properties than bulk materials, thin layers have found application in various fields and play a key role in many technologies. Nanostructures containing GdOxare intensively studied since their properties can be modified by voltage application. It is assumed, that this change is caused by migration of ions in the structure. This thesis conducts re- search on multilayered structures, whose optical response changes reversibly by applying voltage. In these samples, the change is likely caused by migration of hydrogen ions into the GdOx layer. The goal of this thesis is to describe the opti- cal properties of individual layers of the structure and to describe the dynamic change in optical properties. The measurements were conducted with the help of spectroscopic ellipsometry, which allowed in situ voltage application. Keywords: spectroscopic ellipsometry, gadolinium oxide, multilayered nanostruc- tures, in situ
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Characterization of a new deposition system for coating the fibers
Zvonek, Milan ; Salyk, Ota (referee) ; Čech, Vladimír (advisor)
Cieľom bakalárskej práce je charakterizácia depozičného systému na výrobu tenkých vrstiev. Teoretická časť je zameraná na literárnu rešerš o plazme, plazmovej polymerácií, tenkých vrstvách a ich analýzu pomocou infračervenej spektroskopie a spektroskopickej elipsometrie. Experimentálna časť popisuje použité materiály a aparaturu použitú na prípravu tenkých vrstiev pomocou plazmovej polymerácie. Posledná časť popisuje výsledky merania depozícií tenkých vrstiev a ich vyhodnotenie vzhľadom na depozičné podmienky.
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Thin films prepared in RF glow discharge and their physico-chemical properties
Bránecký, Martin ; Boušek, Jaroslav (referee) ; Čech, Vladimír (advisor)
Theoretical part of this master thesis was focused on literature recherché dealing with the formation of thin films, plasma, plasma analyses using mass spectrometry and plasma polymerization. Further, this section describes the analysis of thin films using optical methods such as spectroscopic ellipsometry and FT-IR spectrometry. Experimental part describes the materials which are used for the preparation of thin films as well as a description of the equipment for preparation of thin films using a technology of plasma-enhanced chemical vapor deposition (PE-CVD). Control of deposition conditions and monitoring of plasma with its products result in high reproducibility of thin films. The last part of the thesis describes the results of measurement of the first group of samples and their ellipsometric, mass spectrometry and FT-IR evaluation with respect to the deposition conditions.
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