National Repository of Grey Literature 15 records found  previous11 - 15  jump to record: Search took 0.00 seconds. 
SMV-2017-06: Development of test specimens for SEM
Matějka, Milan ; Horáček, Miroslav ; Meluzín, Petr ; Chlumská, Jana ; Král, Stanislav ; Kolařík, Vladimír ; Krátký, Stanislav ; Knápek, Alexandr
Research and development in the field realization of precise relief structures in the silicon dedicated to the testing of the scanning electron microscopes (SEM) deflection field and accuracy.
SMV-2016-03: Precise relief structures
Matějka, Milan ; Horáček, Miroslav ; Meluzín, Petr ; Chlumská, Jana ; Král, Stanislav ; Kolařík, Vladimír ; Krátký, Stanislav ; Fořt, Tomáš ; Oulehla, Jindřich ; Šerý, Mojmír
Research and development in the field of precise relief structures using electron beam lithography and other ultra-precise micro manufacturing techniques.
Submicron Structures with Deep Relief — Technology of Preparation
Matějka, Milan ; Kuřitka,, Ivo (referee) ; Mgr. Petr Klapetek Ph.D (referee) ; Kolařík, Vladimír (advisor)
The dissertation thesis is focused on research and development in the field of microfabrication by the technology of electron beam lithography. In the first part of this work, the extensive study is conducted in the field of technology of electron beam lithography in terms of physical principles, writing strategies and resist materials. This is followed with description of physical principles of etching for the transfer of relief structures into substrates. The thesis describes innovative techniques in modelling, simulation, data preparation and optimization of manufacturing technology. It brings new possibilities to record deep binary or multilevel microstructures using electron beam lithography, plasma and reactive ion etching technology. Experience and knowledge in the large area of microlithography, plasma and anisotropic wet-etching of silicon have been capitalized to the design process of manufacturing of nano-patterned membranes. It was followed with practical verification and optimization of the microfabrication process.
SMV-2015-35: Development of test speciments for SEM
Matějka, Milan ; Horáček, Miroslav ; Meluzín, Petr ; Chlumská, Jana ; Král, Stanislav ; Kolařík, Vladimír ; Krátký, Stanislav
Research and development in the field of realisation of precise relief structure for testing imaging of scanning electron microscopes (SEM) using micro-lithographic techniques of recording in the silicon. Development in the field of creating of graphic elements of test structures. Development of improving the quality and accuracy of the calibration structures in terms of technical processes for their preparation.
SMV-2014-28: Development of test specimens for SEM
Matějka, Milan ; Horáček, Miroslav ; Meluzín, Petr ; Chlumská, Jana ; Král, Stanislav ; Kolařík, Vladimír ; Urbánek, Michal ; Krátký, Stanislav
The aim of the work was the research/development and realisation of precise relief structure for testing imaging of scanning electron microscopes (SEM) using microlithographic techniques of recording in the silicon. Research includes analysis of graphical input with respect of their use for testing of SEM imaging metric, research of appropriate techniques and procedures suitable for the preparation of relief elements in the silicon with high accuracy and repeatability.

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