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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope
 Pokorná, Zuzana ; Frank, Luděk
Single crystal and polycrystalline aluminium samples were imaged in the scanning low energy electron microscopes at energies of impinging electrons ranging between 0 and 90 eV. The integrated image signal at each energy was calculated and the resulting reflectance curves were compared to electron structure calculations. The influence of vacuum conditions and cleanliness of the substrate surface are discussed.
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Transmission of Electrons through Thin Films by Scanning Low Energy Electron Microscopy
 Müllerová, Ilona ; Hovorka, Miloš ; Fořt, Tomáš ; Frank, Luděk
For examination of thin films by transmitted electrons (TE) the Transmission Electron Microscope is used at primary beam energies in hundreds of keV. The Scanning Electron Microscopes (SEM) utilize reflected electrons in order to image surfaces but recently the TE mode has been introduced into SEM at much lower electron energies.
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