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Preparation of optical thin films by chemical vapor deposition
Koryčánek, Adam ; Kvapil, Michal (referee) ; Kolíbal, Miroslav (advisor)
This work is focused on the comparison between physical vapor deposition methods of thin antireflective layers and chemical vapor deposition (CVD) methods, for applications in the field of optics. The work begins with basic concepts and principles related to anti-reflective coatings, their deposition and characterization. Furthermore, in the experimental part, the techniques of ellipsometry, atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) are used to characterize the properties of the layers and their comparison.
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SPM Methods Based On The Quartz Resonator Probes
Wertheimer, Pavel ; Sobotík, Pavel (referee) ; Číp, Ondřej (referee) ; Šikola, Tomáš (advisor)
The thesis is focused on development of scanning probe microscope systems, especially development and implementation of quartz resonator probes. The quartz resonator probes, compared to the standard silicon cantilevers, have several advantages. It is in particular their mechanical properties and possibility of direct electrical readout of the deflection signal. Due to the fact, the probes are easy to implement even into more complex SPM systems. The thesis deals with development of universal and open SPM control system electronics. The electronics consist of the commercial SPM control and oscillation units, the development of the other electronic parts (such as the high voltage amplifier and the preamplifier units) is described in the thesis. Further, the thesis reports on development of the qPlus UHV LT SPM microscope system that was carried out at Universität Hamburg. Part of it was development of the qPlus preamplifier able to operate at liquid helium temperature. The third topic of the thesis is the implementation of qPlus technology into the UHV VT SPM microscope suitable to operate in situ with a scanning electron microscope. The qPlus sensors and the universal UHV preamplifier were designed and manufactured. Test measurements were conducted on all of the developed systems.
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Fabrication of the STM tips - static and dynamic etching method
Jonner, Jakub ; Spousta, Jiří (referee) ; Kostelník, Petr (advisor)
This bachelor thesis deals with the static and dynamic method of electrochemical etching way of fabrication tips for Scanning Tunneling Microscope (STM). This thesis describes basic principles of the mentioned methods and the construction solutions of the etching apparatuses. An extensive set of measurements was performed in order to obtain the main goal of the thesis – to determine the influence of various etching parameters on the process and final product. In case of static method, we used various concentrations of KOH solution, depths of plunge of the wolfram wire in to the etching solution and setpoints of the etching voltage. In case of dynamic method, we used also various concentrations of KOH solution and different settings of the etching solution flow rate and setpoints of the etching voltage. The ideal configuration of the etching parameters is presented at the end of the thesis as well with the comparison of the etching results from both of the eching methods.
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Characterization of 1-D Nanostructures by SPM Methods
Škoda, David ; Čech, Vladimír (referee) ; Pavlík, Jaroslav (referee) ; Dub, Petr (advisor)
The thesis is aimed at the characterization of carbon nanotubes and silver nanowires by Scanning Probe Microscopy, namely Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Conductive AFM (CAFM) and Scanning Near-Field Optical Microscopy (SNOM). Carbon nanotubes were analyzed by STM, AFM and CAFM microscopy. In a designed apparatus the silver nanowires were fabricated by template assisted deposition and were analyzed with respect to their geometry (AFM), local conductivity (CAFM) and optical properties (SNOM, microreflex spectroscopy). It was found that preferential type of carbon nanowires depends on the fabrication process. The measurements of local conductivity of the nanotubes revealed the similarity with the STM measurements. The AFM measurements of silver nanowires confirmed their growth inside the pores of polycarbonate template. Single nanowires exhibits the semiconducting behavior according to I--V measurement and localized plasmon resonances.
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SPM Methods Based On The Quartz Resonator Probes
Wertheimer, Pavel ; Sobotík, Pavel (referee) ; Číp, Ondřej (referee) ; Šikola, Tomáš (advisor)
The thesis is focused on development of scanning probe microscope systems, especially development and implementation of quartz resonator probes. The quartz resonator probes, compared to the standard silicon cantilevers, have several advantages. It is in particular their mechanical properties and possibility of direct electrical readout of the deflection signal. Due to the fact, the probes are easy to implement even into more complex SPM systems. The thesis deals with development of universal and open SPM control system electronics. The electronics consist of the commercial SPM control and oscillation units, the development of the other electronic parts (such as the high voltage amplifier and the preamplifier units) is described in the thesis. Further, the thesis reports on development of the qPlus UHV LT SPM microscope system that was carried out at Universität Hamburg. Part of it was development of the qPlus preamplifier able to operate at liquid helium temperature. The third topic of the thesis is the implementation of qPlus technology into the UHV VT SPM microscope suitable to operate in situ with a scanning electron microscope. The qPlus sensors and the universal UHV preamplifier were designed and manufactured. Test measurements were conducted on all of the developed systems.
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Development of Instrumental Equipment for the Characterization of Nanostructures
Nováček, Zdeněk ; Ošťádal, Ivan (referee) ; Fejfar, Antonín (referee) ; Šikola, Tomáš (advisor)
The thesis focuses on the development of instruments used for surfaces and nanostructures characterization. Individual techniques of scanning probe microscopy provide different information of the sample surface. The resolution of scanning probe microscopy, providing 3D topography information, reaches subnanometer values or even an atomic level. Therefore, the scanning probe microscopy is one of the most employed method in the field of nanotechnology. The thesis describes the details of development of two scanning probe microscopes intended for measurement under ultra high vacuum conditions. As for the first one, many changes were proposed leading to its better variability, extended functionality and increased user comfort. The second microscope is being design with the aim of its combination with other analytic techniques, especially with scanning electron microscopy. An integral part of scanning probe microscopes is a precise positioning system for navigation of the probe to the selected site. Therefore, the thesis also deals with the development of linear piezoceramic actuators used not only in the ultra high vacuum compatible microscopes but also as a general purpose nanomanipulators.
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Characterization of 1-D Nanostructures by SPM Methods
Škoda, David ; Čech, Vladimír (referee) ; Pavlík, Jaroslav (referee) ; Dub, Petr (advisor)
The thesis is aimed at the characterization of carbon nanotubes and silver nanowires by Scanning Probe Microscopy, namely Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Conductive AFM (CAFM) and Scanning Near-Field Optical Microscopy (SNOM). Carbon nanotubes were analyzed by STM, AFM and CAFM microscopy. In a designed apparatus the silver nanowires were fabricated by template assisted deposition and were analyzed with respect to their geometry (AFM), local conductivity (CAFM) and optical properties (SNOM, microreflex spectroscopy). It was found that preferential type of carbon nanowires depends on the fabrication process. The measurements of local conductivity of the nanotubes revealed the similarity with the STM measurements. The AFM measurements of silver nanowires confirmed their growth inside the pores of polycarbonate template. Single nanowires exhibits the semiconducting behavior according to I--V measurement and localized plasmon resonances.
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Fabrication of the STM tips - static and dynamic etching method
Jonner, Jakub ; Spousta, Jiří (referee) ; Kostelník, Petr (advisor)
This bachelor thesis deals with the static and dynamic method of electrochemical etching way of fabrication tips for Scanning Tunneling Microscope (STM). This thesis describes basic principles of the mentioned methods and the construction solutions of the etching apparatuses. An extensive set of measurements was performed in order to obtain the main goal of the thesis – to determine the influence of various etching parameters on the process and final product. In case of static method, we used various concentrations of KOH solution, depths of plunge of the wolfram wire in to the etching solution and setpoints of the etching voltage. In case of dynamic method, we used also various concentrations of KOH solution and different settings of the etching solution flow rate and setpoints of the etching voltage. The ideal configuration of the etching parameters is presented at the end of the thesis as well with the comparison of the etching results from both of the eching methods.
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