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Autocompensation of operational amplifier offset for precise measurement
Prášek, David ; Khateb, Fabian (referee) ; Prokop, Roman (advisor)
This work deals with the problems of the design of two stage operational amplifier with automatic offset compensation for precise measurement. Full design operational amplifier is aimed at appropriate realization in technology CMOS07 with usage Cadence design environment. The goal of the design is minimum offset value as well as the adherence to the parameters of the operational amplifier which are introduced in submission of the thesis.
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Autocompensation of operational amplifier offset for precise measurement
Prášek, David ; Khateb, Fabian (referee) ; Prokop, Roman (advisor)
This work deals with the problems of the design of two stage operational amplifier with automatic offset compensation for precise measurement. Full design operational amplifier is aimed at appropriate realization in technology CMOS07 with usage Cadence design environment. The goal of the design is minimum offset value as well as the adherence to the parameters of the operational amplifier which are introduced in submission of the thesis.
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The smart electronic unit for precise measurement of refractive index of air in a nano-positioning stage for scanning probe microscopy (SPM)
Hucl, Václav ; Čížek, Martin ; Buchta, Zdeněk ; Mikel, Břetislav ; Lazar, Josef ; Číp, Ondřej
When the traceable measurement of dimensions of samples in scanning probe microscopy is needed the position of the probe tip has to be monitored by a set of laser interferometers. The measurement is done very often during standard atmospheric conditions so the changes of the refractive index of air have an influence to measured values of the length with 1.0exp(-4) relatively. Thus the measurement of the refractive index of air and application of the instantaneous value of the index to all of measurement interferometric axes is necessary. In the work we developed new concept of electronic unit which is able to monitor the refractive index of air on basis of measurement of weather conditions: temperature, humidity and pressure of the air. The unit uses modified Edlen formula for calculation of the refractive index. The next step of the work is verification of accuracy of the measuring capability of the unit. We tested the accuracy with reference unit which measure the refractive index of air by a set of etalon sensors. The expected accuracy of the smart electronic unit falls to the 4.1exp(-7) relatively. The important advantage of the unit is very low power consumption of electronics so the unit causes very small temperature effects to the measuring process.
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Laser interference nano-comparator for length sensor calibration in nanometric scale
Číp, Ondřej ; Mikel, Břetislav ; Čížek, Martin ; Šmíd, Radek ; Buchta, Zdeněk ; Lazar, Josef
In the work we present new laser measuring system for precise calibrations of length measuring transducers. This gauge is called nano-comparator because the resolution of the positioning of the measuring probe is in order of nanometers. The gauge works fully self-controlled and it is equipped by control software which is able to calibrate wide area of transducers. We put main stress to compensating of thermal dilatation of the gauge body and to eliminating of imperfection of linear guide ways which are used for positioning of the testing probe of the gauge. The work presents the first records of scale calibration of an incremental transducer.
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