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Material printing of UVB disposable dosimeter
Fryčová, Gabriela ; Ettler,, Karel (referee) ; Veselý, Michal (advisor)
The aim of the bachelor's thesis was the preparation of photosensitive layers responding by colour change to the exposure dose and their subsequent calibration to UVB irradiation doses of 500 and 1 000 mJcm2 using calibration agents and layer thickness change. The experimental part focuses on the preparation and application of the layers and the study of their colour response to the exposure dose. The validity of the reciprocity law was verified. The simplicity of preparation and use of the resulting disposable UVB dosimeters was emphasized.
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Photocatalytic activity of printed hybrid layers of titanium dioxide
Sýkorová, Kateřina ; Krystyník, Pavel (referee) ; Veselý, Michal (advisor)
The main aim of this thesis was to optimalise composition of the titanium dioxide with a silica binder deposited on a PET foil. Emphasis was put on achieving maximum possible adhesion and hardness of the layer and the effect on photocatalytic activity. For the evaluation of photocatalytic activity comparative experiments with prepared layers were performed. Benzoic acid, dimethyl sulfoxide and azo dye Acid Orange 7 were used as model pollutants. Photocatalytic activity was investigated using UV-VIS spectrophotometry, formal rate constants and degree of conversion were also determined. The study results can be used for removing water pollutants from the water solution.
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Preparation of photocatalytically active layers of titanium dioxide
Šeffer, Lukáš ; Jančovičová, Viera (referee) ; Veselý, Michal (advisor)
This bachelor work gives an overview about preparation of titanium dioxide and silicon dioxide thin films by sol-gel process, using coating methods as spin coating, dip coating, capillary and cell coating, flow coating, spray coating, pyrosol process, chemical vapour deposition and printing. The procedures of composite films preparation obtained by mixed sols of titanium dioxide and silica dioxide are also discussed together with preparation of double layer films, when titanium dioxide is coated on glass substrate covered by a silica dioxide layer. The methods of photocatalytic activity testing are the important part of this work.
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Study of optical properties of thin films of perovskiteFAPbBr3 precursors
Smolková, Denisa ; Čech, Vladimír (referee) ; Zmeškal, Oldřich (advisor)
This thesis examines the preparation of thin layers of material for photovoltaic applications with focused on perovskites and determining their optical properties. Basic information about the photovoltaic panels, especially about the perovskites, and the preparation of thin layers is supplied in the theoretical section. This section includes description of optical properties and the main method of study of optical properties, spectroscopic ellipsometry. Experimental section is focused on the preparation of thin layers of perovskites FAPbBr3 and its precursors by spin-coating. Optical properties are evaluated using profilometry, UV VIS spectrometry and spectroscopic ellipsometry. The conclusion summarizes the results of this experiment with focused on comparison of ellipsometric spectrums of perovskites and its precursors.
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Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element
Pokorný, David ; Šik, Ondřej (referee) ; Polčák, Josef (advisor)
This diploma thesis deals with methodology of thin film thickness determination using X-ray radiation of silver anode which provides radiation with energy of 2984,3 eV. This energy is twice as high as the standard aluminium radiation which allows a measurement of new photoelectron lines with higher bonding energy and it also provides thanks to the higher photoelectron energy greater information depth. In order to get the right results it was necessary to calibrate the spectrometer Kratos Axis Supra in the silver anode mode first and found out the form of the transmission function. The determination of the thickness of the thin layer was demonstrated by the comparation of the ratio of different photoelectron lines intensities with the theoretical model. For that purpose was specifically used the Si 1s and Si 2p peak bound in the substrate in the Si-Si bonding or in the thin oxid layer in the Si-O bonding. The results show that for thin SiO2/Si film thickness determination is the best to use the intensity ratio of only one photoelectron line. A silver anode however provides greater information depth.
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Printed chemical sensors of UV light
Fanglová, Michaela ; Čeppan, Michal (referee) ; Veselý, Michal (advisor)
The main task of the bacherol´s thesis was to prepare a photosensitive layer reacting to the radiation dose with a color change. And to calibrate the prepared dosimeters to the required values of the radiation doses of the UVB radiation. This bacherol´s thesis is about light dosimeters, which are based on photochemical reactions. These reactions take place in a thin polymer layer. The experimental study focoused on the preparation and application of photosensitive compositions. These prepared dosimeter compositions were exposed to different doses of UVB radiation, where the color response to the exposure was monitored.
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Kinetic study of photochemical reactions in thin printed layer
Rudická, Andrea ; Čeppan,, Michal (referee) ; Veselý, Michal (advisor)
This diploma thesis deals with a study of kinetics of photochemical reactions in a thin printed polymer layer. The experimental part deals with the composition preparation and layers coating. The prepared layers were exposed and subsequently studied for their colour response to the light. The aim of this work was to prepare a photosensitive layer with a significant colour change between individual doses of radiation, to improve the mechanical resistance of the layers, to adjust the sensitivity of the compositions to UVB radiation and to study the kinetics of the photochemical reaction used.
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Study of thin film organic materials thickness
Hegerová, Lucie ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The diploma thesis deals with the determination of thickness and refractive index of thin organic films using image analysis. In the theoretical part there are described principles of the methods, which are used to prepare the films (spin coating, inkjet printing, vapour deposition), the characteristics of thin films, ways of finding out the thickness and refractive index of substances (weight methods, electric methods, method based on measurement of absorption coefficient of light, interference microscopy, ellipsometry) and also image analysis (harmonic and wavelet analysis). Interference microscope Epival - Interpako (Carl Zeiss Jena), digital camera Nikon Coolpix 5400 and computer were used for the determination of thickness and refractive index. The thicknesses of layers were set on the basis of interference images of edges and grooves – both from the side of the metal contact and the side of underlying glass. The refractive indices of thin layers were then set using the recorded figures. In the final part of the thesis there are discussed the results of interference images photographed along the full length of the aluminium contact which are used for measuring electrical characteristics of DPP structures. The produces are thicknesses and refractive indices of individual layers.
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Study of refractive index dispersion dependences with using of interference microscopy
Schmiedová, Veronika ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The master´s thesis deals with the study of optical properties of thin transparent layers on the organic materials (PPV, P3HT, TiO2, DPP) and especially with the determination of dispersion dependences of refractive index of prepared thin layers. In the theoretical part there are described principles of deposition thin layers of the analyzed materials and their properties. In addition, there are also described methods of optical properties measurements (optical and interference microscopy and ellipsometry). The combination of interference microscope with digital camera was used for determination of refractive index. The image analysis was used for the determination of parameters (with help of the software HarFA). The images of thin layers surfaces were analyzed from the side of the metal contact as well as from the side of glass. In conclusion, there are presented results of the refractive index of the thin layers obtained from the measured values.
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