National Repository of Grey Literature 45 records found  beginprevious36 - 45  jump to record: Search took 0.00 seconds. 
Communication and control card for electron microscope
Robotka, Jan ; Petyovský, Petr (referee) ; Macho, Tomáš (advisor)
The main aim of this thesis is to design a communication and control card for an electron microscope, eventually for other equipments of the company Delong Instruments a.s., which is dealing with its development and production. This card should replace existing communication card because of its low computational performance. Also, it should replace control and measure card manned with A/D and D/A converters. Thus, the new card will be providing not only the communication with a superior PC and other electronic systems, but also the control of other subsystems of the electron microscope, the determining of processional states and the measuring of internal physical quantities. At the beginning the requirements were determined and the main concept was made with the inclusion of the simple block diagram. It was very important to choose a suitable microcontroller, which will be an intelligence of the whole card and so it will be the most important component. The accent was set mainly on the sufficient computational performance, high modularity of its periphery, good vision of the future innovation and support and, of course, the price. The next requirement was the implementation of the Ethernet, which will be used for the communication between the card and the superior PC. The microcontroller which was chosen have the core architecture ARM Cortex-M3 and it is described in separate chapter. The next part of this thesis is dealing with the main communication standard of the card, which is the Ethernet. After the general description, the Ethernet was mainly discussed in context of the chosen microcontroller. The possibilities of the application of higher layer TCP/IP protocols were also discussed. Implied part of the thesis was the selection of other important components, especially A/D and D/A converters. Its characteristics will have a big effect on the characteristics of the card. In the last and the most important phase the electrical scheme was designed and it was described in detail. This scheme is the main result of this thesis and it is the main document for the future realization. Designed card will be able to process and control 16 differential analogue input signals, 16 differential analogue output signals, 8 digital inputs, 8 simple digital outputs and 4 digital outputs triggered by optocouplers. It will be able to communicate with the superior PC over the Ethernet with the maximum bit rate of 100 Mbit/s, with other electronic cards over the serial line UART through the optical fibers and with other internal and external equipments over the RS-485 and RS-232.
Contrast in image acquired by ionization detector in VP SEM
Goroš, Pavel ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work deal with problems of investigation materials electron beam. This project is focuses on investigation materials by the help of method environmental scan electron microscopy (ESEM) and describes her patterns. The perfection of ESEM excel above all at studies non - conducting or water containing, often biological samples. These samples not to be in no way prepared or cut – and – dries, in contradistinction to classical scanning electron microscope and thanks is under investigation their native surface structure without desiccation breaking. The general aim is determination of contrast in image acquired by ionization detector.
Testing of service life of the bolt fastening used in electron microscopy
Habarka, Ondrej ; Radoš, Jiří (referee) ; Krejsa, Jiří (advisor)
Cílem této bakalářské práce je vybrat vhodný materiál a jeho povrchovou úpravu pro šroubový spoj s jemným závitem na držáku vzorku v elektronovém mikroskopu. První částí je přehled použitelných materiálů a povrchových úprav, které jsou nemagnetické, tudíž neovlivňují elektronový paprsek v mikroskopu. Dále se práce zabývá tvorbou testovacího zařízení na testování životnosti jednotlivých vzorků závitových tyčí. Výsledkem práce je porovnání testovaných materiálů a výběr jednoho nejvhodnějšího pro reálné použití.
Scanning electron microscopy on samples at elevated temperature
Flekna, Martin ; Rudolf, Miroslav (referee) ; Průša, Stanislav (advisor)
This bachelor thesis deals with scanning electron microscopy at samples which are heated (by electric current) up to 650 °C. The theoretical description of basic principles of electron microscopy is given. The effect of different factors that influence sample imagining and image quality is analyzed in experimental part.
Properties of cement composites with fiber reinforcement
Jankech, Filip ; Sitek,, Libor (referee) ; Bodnárová, Lenka (advisor)
This thesis summarizes the knowledge of the possibility of using organic fibres as dispersed reinforcement into cement composites. It is concretely a summary of knowledge about the types and properties of synthetic and cellulosic fibres, their influence on the properties of fresh and hardened cement composite and lastly a description of the fire resistance of cement composites and the effect of organic fibres on the action of those composites at high temperatures and in the presence of fire. The experimental part is supposed to verify the effect of the cellulose fibres on increasing the durability of the cement composite at high temperatures.
The possibilities of using nanoparticles of various metals as the markers for immunocytochemical labelling in field emission scanning electron microscopy
EIBLOVÁ, Veronika
Nowadays, electron microscopy is a widespread method used in many biological branches like medicine, physical science, mikrobiology or material technology. Scanning electron microscope is a type of an electron microscope that shows the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The signal of electrons reveals information about the sample such as morphology, chemical composition and structure and materials. Gold nanoparticles are widely used as a marker for immunolabeling in these days. The main point of this research was to find other nanoparticles, which can be used for multiple immunolabeling. The main task of this study is to conjugate these particles with atibodies, to use them for immunolocalisation on the convenient biological sample and to observe it in FESEM JEOL JSM-7401F.
Segment ionization detector for environmental scanning electron microscope
Schneider, Luděk
The work deals with development and realization of segment ionization detector for environmental scanning electron microscope (ESEM). The work contains study of detection of signal detection for different sizes and spatial placing of a ionization and detection capacity determined by segment electrodes of the detector.
Wave-optical contrasts in the scanning electron microscope
Seďa, Bohuslav
The work deals with study of origin and properties of wave-optical contrasts in the scanning electron microscope with slow electrons.
The first experience with a low voltage electron microscope
Nebesářová, Jana
The low voltage electron microscope LV EM 5 manufactured by Delong Instruments is described and methods of preparation of biological specimens for the observation in this microscope are briefly evaluated. LV EM 5 is a unique apparatus that could replace in medical and biological research laboratories high volatage transmission electron microscopes.

National Repository of Grey Literature : 45 records found   beginprevious36 - 45  jump to record:
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