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Scintillation SE Detector for VP SEM
Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
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Methods of frequency stabilization of semicondutor lasers
Kozelský, Adam ; Stehlík, Jiří (referee) ; Mikel, Břetislav (advisor)
The main aim of the thesis is a frequency stabilization of the DFB semiconductor laser diodes. The temperature stability of the laser diode chip, the stability and the noise of the injection current and the backward reflections are the crucial parameters which affects the frequency stability. These influences are described and the resolution is proposed. The theory of the external methods of the frequency stabilization and the comparison of these methods is presented. One method was choosed and this method was realized for 760 and 1540 nm wavelength laser diodes. In this method was used the frequency stabilization based on the linear absorption to the spectral lines of the gases. The diploma work is closed by the measured results of the frequency stability of the used laser diodes and by the comparison of level of stability achieved by the other methods.
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Scintillation SE Detector for VP SEM
Kozelský, Adam ; Čudek, Pavel (referee) ; Jirák, Josef (advisor)
This work contains description of basic properties and principles of electron microscopy focused on scanning electron microscopy. It describes construction solutions of a microscope, interaction between electron beam and sample, generation of backscattered and secondary electrons. Next chapters are dealing with development of electron microscopy and environmental scanning electron microscopy. The experimental part of this thesis is focuses on the detection of secondary electrons with scintillation detector in environmental scanning electron microscope at higher pressure in the specimen chamber. Concretely is focused on optimization of collecting grid voltage and measurement of pressure dependences.
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|
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Methods of frequency stabilization of semicondutor lasers
Kozelský, Adam ; Stehlík, Jiří (referee) ; Mikel, Břetislav (advisor)
The main aim of the thesis is a frequency stabilization of the DFB semiconductor laser diodes. The temperature stability of the laser diode chip, the stability and the noise of the injection current and the backward reflections are the crucial parameters which affects the frequency stability. These influences are described and the resolution is proposed. The theory of the external methods of the frequency stabilization and the comparison of these methods is presented. One method was choosed and this method was realized for 760 and 1540 nm wavelength laser diodes. In this method was used the frequency stabilization based on the linear absorption to the spectral lines of the gases. The diploma work is closed by the measured results of the frequency stability of the used laser diodes and by the comparison of level of stability achieved by the other methods.
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