keywords:"Thin films" - Search Results - Digital Repository

guest :: login Digital Repository
		Search		Submit		Help		About

Home > Search Results: keywords:"Thin films"

Search:

Search Tips :: Advanced Search

Search collections:

Sort by:	Display results:	Output format:

	Modification of Bi.sub.2./sub.Te.sub.3./sub. nanolayers Zeipl, Radek ; Pavelka, Martin ; Jelínek, Miroslav ; Vaniš, Jan ; Šroubek, Filip ; Walachová, Jarmila Our Bi.sub.2./sub.Te.sub.3./sub. nanolayers were prepared by laser ablation. If we use different depositon condition, prepared layers will have different properties, exactly with rising temperature of substrate during deposition laeyrs becoming smoother. We present STM picture of 60nm thick Bi.sub.2./sub.Te.sub.3./sub. prepared on substrate with temperature during deposition of 400.sup.0.sup.C. We also present modification of layer after many scans were realized by STM on the same place. Detailed record
	Thickness dependence of transport properties of Bi.sub.2./sub.Te.sub.3./sub. layers Zeipl, Radek ; Lošťák, P. ; Pavelka, Martin ; Žďánský, Karel ; Jelínek, Miroslav ; Walachová, Jarmila The transport properties of layers, prepared by laser ablation, as Hall mobility and conductivity on their thickness at room temperature are presented. This thermoelectric materials is potential candidate for many applications as for thermoelectric devices for power generation, cooling and sensors. Detailed record
	Thickness dependence of transport properties of Bi.sub.2./sub.Te.sub.3./sub. layers Zeipl, Radek ; Lošťák, P. ; Pavelka, Martin ; Žďánský, Karel ; Jelínek, Miroslav ; Walachová, Jarmila The transport properties of layers, prepared by laser ablation, as Hall mobility and conductivity on their thickness at room temperature are presented. This thermoelectric materials is potential candidate for many applications as for thermoelectric devices for power generation, cooling and sensors. Detailed record
	Optical properties of the GaN on sapphire Skalský, Miroslav ; Janta, Jiří ; Čtyroký, Jiří ; Stejskal, J. ; Hüttel, I. The method of mode spectroscopy was used to measure optical properties of epitaxial layers of gallium nitride (GaN) deposited onto the sapphire substrate. The results of the measurement of the layer thickness, refractive indices, and the attenuation of guided modes at the wavelengths of 632.8 nm and 781 nm are presented. From experimental values of attenuation of different guided modes, the contributions of bulk absorption and scattering at the interfaces of the layer to the total optical loss in the waveguide are determined. Detailed record
	Note on the simultaneous measurement of thickness and composition of Ga.sub.x./sub.In.sub.1-x./sub.As.sub.y./sub.P.sub.1-y./sub./InP thin films Starý, V. ; Olšovec, P. ; Jurek, Karel ; Peřina, Vratislav ; Kohout, Jindřich Detailed record
	Příprava a vlastnosti polyimidových vrstev. (Preparation and properties of polyimide layers) Berková, Daniela Detailed record
	Simultaneous measurement of composition and thickness of quaternarycompound films by EPMA Starý, V. ; Procházková, Olga ; Jurek, Karel ; Kohout, Jindřich Detailed record
	Thin films study by means of optically excited surface plasmons Homola, Jiří Detailed record
	Characterization of As - Se chalcogenide glasses Sklenář, A. ; Bezdička, Petr Detailed record
	Thin Films of Sb2S3 Doped by Sm3+ Ions Frumarová, Božena ; Bílková, M. ; Frumar, M. ; Repka, M. ; Jedelský, J. Pure and Sm3+ doped amorphous thin films of Sb2S3 were prepared by thermal co-evaporation of Sb2S3 and Sm metal. From transmittance measurement, the absorption edge, index of refraction, thickness , Eg opt relative permittivity, single oscillator energy and dispersion energy were determined. Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.

Digital Repository :: :: :: ::
Powered by v1.1.2
Maintained by

This site is also available in the following languages:
Česky English