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Noise, Transport and Structural Properties of High Energy Radiation Detectors Based on CdTe
Šik, Ondřej ; Lazar, Josef (referee) ; Navrátil, Vladislav (referee) ; Grmela, Lubomír (advisor)
Poptávka ze strany vesmírného výzkumu, zdravotnictví a bezpečnostního průmyslu způsobila v posledních letech zvýšený zájem o vývoj materiálů pro detekci a zobrazování vysokoenergetického záření. CdTe a jeho slitina CdZnTe. jsou polovodiče umožnují detekci záření o energiích v rozsahu 10 keV až 500 keV. Šířka zakázaného pásma u CdTe / CdZnTe je 1.46 -1.6 eV, což umožňuje produkci krystalů o vysoké rezistivitě (10^10-10^11 cm), která je dostačující pro použití CdTe / CdZnTe při pokojové teplotě. V mé práci byly zkoumány detektory CdTe/CdZnTe v různých stádiích jejich poruchovosti. Byly použity velmi kvalitní spektroskopické detektory, materiál s nižší rezistivitou a výraznou polarizací, detektory s asymetrií elektrických parametrů kontaktů a teplotně degenerované vzorky. Z výsledků analýzy nízkofrekvenčního šumu je patrný obecný závěr, že zvýšená koncentrace defektů způsobí změnu povahy původně monotónního spektra typu 1/f na spektrum s výrazným vlivem generačně-rekombinačních procesů. Další výrazná vlastnost degenerovaných detektorů a detektorů nižší kvality je nárůst spektrální hustoty šumu typu 1/f se vzrůstajícím napájecím napětí se směrnicí výrazně vyšší než 2. Strukturální a chemické analýzy poukázaly, že teplotní generace detektorů způsobuje difuzi kovu použitého při kontaktování a stopových prvků hlouběji do objemu krystalu. Část mé práce je věnována modifikaci povrchu svazkem argonových iontů a jejímu vlivu na chemické složení a morfologii povrchu.
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Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element
Pokorný, David ; Šik, Ondřej (referee) ; Polčák, Josef (advisor)
This diploma thesis deals with methodology of thin film thickness determination using X-ray radiation of silver anode which provides radiation with energy of 2984,3 eV. This energy is twice as high as the standard aluminium radiation which allows a measurement of new photoelectron lines with higher bonding energy and it also provides thanks to the higher photoelectron energy greater information depth. In order to get the right results it was necessary to calibrate the spectrometer Kratos Axis Supra in the silver anode mode first and found out the form of the transmission function. The determination of the thickness of the thin layer was demonstrated by the comparation of the ratio of different photoelectron lines intensities with the theoretical model. For that purpose was specifically used the Si 1s and Si 2p peak bound in the substrate in the Si-Si bonding or in the thin oxid layer in the Si-O bonding. The results show that for thin SiO2/Si film thickness determination is the best to use the intensity ratio of only one photoelectron line. A silver anode however provides greater information depth.
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Analysis of noise characteristics of radioactive emission detectors
Šik, Ondřej ; Pfeifer, Václav (referee) ; Andreev, Alexey (advisor)
The main goal of this Master’s thesis is to describe relationship between low frequency noise spectral characteristics of Cadmium-Telluride radiation detectors depending on applied voltage and detectors reaction to illumination of various wavelengths. Also, the reaction and influence of higher operating temperatures were investigated. The noise measurements shown that the dominant noise type at low frequencies is the 1/f noise. Several samples with different resistivity were tested. By comparing results, we are able to estimate the quality of detectors and their sensibility to illumination and higher operating temperatures. We have found that all the studied CdTe detectors are sensitive to one particular wavelength of 548nm. Resulting data were processed by EasyPlot program that provided graphical representation of spectral noise characteristics. All measured characteristics of tested samples are compared and it’s estimated the similarity between the samples.
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Electron tweezer
Štubian, Martin ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
Táto práca sa zaoberá novým spôsobom manipulácie mikro a nano objektov, konkrétne tekutých AuGe ostrovčekov pomocou elektrónového zväzku. V prvej časti je diskutovaný mechanizmus manipulácie, je popísaný princíp a ďalej sú uvedené experimenty a simulácie potvrdzujúce tento princíp. Druhá časť práce sa zaoberá využitím uvedenej manipulácie k tvorenie mikro/nano štruktúr.
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Surface modification by nano-droplets controlled by electron tweezers
Dao, Radek ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
This master's thesis is focused on the study of the consequences of electron beam induced motion of Au-Ge alloy nanodroplets on germanium surface. The text consists of two parts. The theoretical part gives an overview of measurement and fabrication techniques used for the experiments. The description of these techniques is mainly focused on topics needed to understand the ideas behind the experiments and their results. The topics covered here are the Atomic Force Microscopy, Scanning Electron Microscopy and Electron Beam Lithography. These are followed by an introduction to the gold-germanium material system and the movement of Au-Ge alloy nanodroplets. The practical part gives a roughly chronological guide throughout the whole experimental process, including the search for a suitable sample fabrication method, the surface modification itself and its measurement. Temperature calibration of the heating system is also mentioned.
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Quantitative analysis of matrix elements using SIMS and LEIS methods
Staněk, Jan ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
This thesis studies comparison and connection of two spectrometric methods – low energy ion scattering spektrometry (LEIS) and secondary ion mass spectrometry (SIMS). SIMS method, despite its many positive qualities, suffers of so called matrix effect, which makes quantifiaction of data very difficult. LEIS method on the other hand is immune to this effect and so it’s suitable completion of SIMS method. As a convenient sample have been chosen AlGaN samples with various concentration of gallium and aluminium. In the first part of thesis is introduced physical essence of SIMS and LEIS method, experimental details and studied samples. In second part of the thesis there’s a description of measurements and comparison of data gained by each method.
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Surface modification by nano-droplets controlled by electron tweezers
Dao, Radek ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
This master's thesis is focused on the study of the consequences of electron beam induced motion of Au-Ge alloy nanodroplets on germanium surface. The text consists of two parts. The theoretical part gives an overview of measurement and fabrication techniques used for the experiments. The description of these techniques is mainly focused on topics needed to understand the ideas behind the experiments and their results. The topics covered here are the Atomic Force Microscopy, Scanning Electron Microscopy and Electron Beam Lithography. These are followed by an introduction to the gold-germanium material system and the movement of Au-Ge alloy nanodroplets. The practical part gives a roughly chronological guide throughout the whole experimental process, including the search for a suitable sample fabrication method, the surface modification itself and its measurement. Temperature calibration of the heating system is also mentioned.
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Electron tweezer
Štubian, Martin ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
Táto práca sa zaoberá novým spôsobom manipulácie mikro a nano objektov, konkrétne tekutých AuGe ostrovčekov pomocou elektrónového zväzku. V prvej časti je diskutovaný mechanizmus manipulácie, je popísaný princíp a ďalej sú uvedené experimenty a simulácie potvrdzujúce tento princíp. Druhá časť práce sa zaoberá využitím uvedenej manipulácie k tvorenie mikro/nano štruktúr.
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Quantitative analysis of matrix elements using SIMS and LEIS methods
Staněk, Jan ; Šik, Ondřej (referee) ; Bábor, Petr (advisor)
This thesis studies comparison and connection of two spectrometric methods – low energy ion scattering spektrometry (LEIS) and secondary ion mass spectrometry (SIMS). SIMS method, despite its many positive qualities, suffers of so called matrix effect, which makes quantifiaction of data very difficult. LEIS method on the other hand is immune to this effect and so it’s suitable completion of SIMS method. As a convenient sample have been chosen AlGaN samples with various concentration of gallium and aluminium. In the first part of thesis is introduced physical essence of SIMS and LEIS method, experimental details and studied samples. In second part of the thesis there’s a description of measurements and comparison of data gained by each method.
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