|
|
Evaluation of structures of solder joint with printed board circuit
Jakubec, Jiří ; Jirák, Josef (referee) ; Černoch, Pavel (advisor)
The theoretical part of the diploma thesis deals with the basic principles of the scanning electron microscope and the environmental scanning electron microscope. A description of the signals generated by an electrons incidence onto a specimen and detection options of these signals in the mentioned microscopes is included in the work. The experimental part of the work concerns an examination of a quality of several joints soldered by different methods on the printed circuit boards after different stresses by use of a visual check and the instruments of the light microscope and the environmental scanning electron microscope. The acquired data are evaluated and summarized.
|
|
|
Signal Detection by Segmental Ionization Detector in Environmental SEM
Černoch, Pavel ; Jirák, Josef (advisor)
The dissertation thesis deals with signal detection by an ionization detector in the environmental scanning electron microscope and utilization of this detector to gain required information in a specimen image. Main interest is focused on the detector containing several electrodes with a varied geometry arrangement and voltages on these electrodes. The detector was named segmental ionization detector. Detection capabilities of the segmental ionization detector were studied through computer simulations and experiments in the microscope utilizing knowledge from a technical literature background. On the base of the accomplished experiments, the segmental ionization detector has been optimized for the secondary electron detection improvement and at another configuration optimized for a high material contrast acquisition of the specimen image. Consideration of benefits of the examined segmental ionization detectors is included in the work.
|
|
|
Method of Voltage Contrast in ESEM
Buchta, Michal ; Černoch, Pavel (referee) ; Jirák, Josef (advisor)
This graduation thesis deals with the problem of voltage contrast in ESEM. The purpose of this work was to verify influence of used detectors in the dependence on conditions in specimen chamber on the size of voltage contrast. With the conditions in specimen chamber we understand pressure and working conditions of signal detection. We used power transistor as specimen.
|
|
|
Signal Detection by Segmental Ionization Detector in Environmental SEM
Černoch, Pavel ; Jirák, Josef (advisor)
The dissertation thesis deals with signal detection by an ionization detector in the environmental scanning electron microscope and utilization of this detector to gain required information in a specimen image. Main interest is focused on the detector containing several electrodes with a varied geometry arrangement and voltages on these electrodes. The detector was named segmental ionization detector. Detection capabilities of the segmental ionization detector were studied through computer simulations and experiments in the microscope utilizing knowledge from a technical literature background. On the base of the accomplished experiments, the segmental ionization detector has been optimized for the secondary electron detection improvement and at another configuration optimized for a high material contrast acquisition of the specimen image. Consideration of benefits of the examined segmental ionization detectors is included in the work.
|
|
|
Method of Voltage Contrast in ESEM
Buchta, Michal ; Černoch, Pavel (referee) ; Jirák, Josef (advisor)
This graduation thesis deals with the problem of voltage contrast in ESEM. The purpose of this work was to verify influence of used detectors in the dependence on conditions in specimen chamber on the size of voltage contrast. With the conditions in specimen chamber we understand pressure and working conditions of signal detection. We used power transistor as specimen.
|
|
|
Evaluation of structures of solder joint with printed board circuit
Jakubec, Jiří ; Jirák, Josef (referee) ; Černoch, Pavel (advisor)
The theoretical part of the diploma thesis deals with the basic principles of the scanning electron microscope and the environmental scanning electron microscope. A description of the signals generated by an electrons incidence onto a specimen and detection options of these signals in the mentioned microscopes is included in the work. The experimental part of the work concerns an examination of a quality of several joints soldered by different methods on the printed circuit boards after different stresses by use of a visual check and the instruments of the light microscope and the environmental scanning electron microscope. The acquired data are evaluated and summarized.
|
|
|
Implementation analysis of ERP system Infor M3 in international company
Hoffmann, Jakub ; Basl, Josef (advisor) ; Černoch, Pavel (referee)
This thesis analyzes the implementation of the ERP system Infor M3 in international company. The main objective is to analyze the current implementation causes of delay and to recommend measures for future implementation stages to prevent them. The main objective of theoretical part is to analyze global ERP market and summarize available implementation methodologies of ERP systems. Second objective of theoretical part is to analyze the frequent causes of delays in implementation's projects in general and to summarize the basic methods for searching the causes of problems. Practical part is based on knowledge from theoretical part and through a survey identifies the most serious causes of delay in implementation in particular international company. The outcome of this thesis are recommendations for the rest of this implementation project to avoid and prevent the same causes and problems and allow to finish project implementation in time.
|
guest ::
RSS feed.