Original title: Aplikace Kelvinovy silové mikroskopie na dvourozměrných strukturách
Translated title: Application of Kelvin Probe Force Microscopy on Two-Dimensional Structures
Authors: Švarc, Vojtěch ; Kunc,, Jan (referee) ; Kolařík, Vladimír (referee) ; Bartošík, Miroslav (advisor)
Document type: Doctoral theses
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta strojního inženýrství
Abstract: [cze] [eng]

Keywords: Atomic Force Microscopy; Field Effect Transistor; Graphene; Hall Bar; Kelvin Probe Force Microscopy; KPFM; Surface Conductivity.; Surface Potential; grafen; Hall bar; Kelvinova silová mikroskopie; KPFM; mikroskopie atomárních sil; polem řízený tranzistor; povrchová vodivost.; povrchový potenciál

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: https://hdl.handle.net/11012/249176

Permalink: http://www.nusl.cz/ntk/nusl-620413


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Doctoral theses
 Record created 2024-06-30, last modified 2024-07-21


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