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Original title:
Detection of Elliptical Particles in Atomic Force Microscopy Images
Authors: Sedlář, Jiří ; Zitová, Barbara ; Kopeček, Jaromír ; Todorciuc, T. ; Kratochvílová, Irena
Document type: Papers
Conference/Event: ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing, Praha (CZ), 2011-05-22 / 2011-05-27
Year: 2011
Language: eng
Abstract: In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; the measured heights are represented by pixel values. Each sample in our project consisted of elliptical particles of principally the same size; the size could be characterized by the average length and width of a number of salient particles. The method we proposed is based on segmentation of undamaged particles and their approximation by ellipses; the major and minor axes provide robust estimates of the lengths and widths of the particles, respectively. The method is robust to distortions typical of AFM images. Its performance was demonstrated on images of pyrroles and compared with manual detection. Results show that the automatic method could be used in place of the time-consuming manual detection.
Keywords: approximation by ellipses; atomic force microscopy (AFM) imaging; image moments; particles detection; watershed segmentation
Project no.: CEZ:AV0Z10750506 (CEP), CEZ:AV0Z10100520 (CEP), 1M0572 (CEP), GA203/08/1594 (CEP), KAN401770651 (CEP), GAP103/11/1552 (CEP)
Funding provider: GA MŠk, GA ČR, GA AV ČR, GA ČR
Host item entry: ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing, ISBN 978-1-4577-0539-7
Institution: Institute of Information Theory and Automation AS ČR (web)
Document availability information: Fulltext is available at external website.
External URL: http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy images.pdf
Original record: http://hdl.handle.net/11104/0197718
Permalink: http://www.nusl.cz/ntk/nusl-55732
The record appears in these collections:
Research > Institutes ASCR > Institute of Information Theory and Automation
Conference materials > Papers
Authors: Sedlář, Jiří ; Zitová, Barbara ; Kopeček, Jaromír ; Todorciuc, T. ; Kratochvílová, Irena
Document type: Papers
Conference/Event: ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing, Praha (CZ), 2011-05-22 / 2011-05-27
Year: 2011
Language: eng
Abstract: In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; the measured heights are represented by pixel values. Each sample in our project consisted of elliptical particles of principally the same size; the size could be characterized by the average length and width of a number of salient particles. The method we proposed is based on segmentation of undamaged particles and their approximation by ellipses; the major and minor axes provide robust estimates of the lengths and widths of the particles, respectively. The method is robust to distortions typical of AFM images. Its performance was demonstrated on images of pyrroles and compared with manual detection. Results show that the automatic method could be used in place of the time-consuming manual detection.
Keywords: approximation by ellipses; atomic force microscopy (AFM) imaging; image moments; particles detection; watershed segmentation
Project no.: CEZ:AV0Z10750506 (CEP), CEZ:AV0Z10100520 (CEP), 1M0572 (CEP), GA203/08/1594 (CEP), KAN401770651 (CEP), GAP103/11/1552 (CEP)
Funding provider: GA MŠk, GA ČR, GA AV ČR, GA ČR
Host item entry: ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing, ISBN 978-1-4577-0539-7
Institution: Institute of Information Theory and Automation AS ČR (web)
Document availability information: Fulltext is available at external website.
External URL: http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy images.pdf
Original record: http://hdl.handle.net/11104/0197718
Permalink: http://www.nusl.cz/ntk/nusl-55732
The record appears in these collections:
Research > Institutes ASCR > Institute of Information Theory and Automation
Conference materials > Papers
Record created 2011-09-06, last modified 2024-01-26