Original title: Model stárnutí unipolárního tranzistoru
Translated title: FET aging model
Authors: Novosád, Jiří ; Legát, Pavel (referee) ; Semiconductor, Aleš Litschmann, ON (advisor)
Document type: Master’s theses
Year: 2008
Language: cze
Publisher: Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií
Abstract: [cze] [eng]

Keywords: aging; degradation; DOE; experiment; extraction; HCI; measurement; verification; degradace; DOE; experiment; extrakce; HCI; měření; stárnutí; verifikace

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/1089

Permalink: http://www.nusl.cz/ntk/nusl-545089


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Academic theses (ETDs) > Master’s theses
 Record created 2024-04-02, last modified 2024-04-03


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