Original title: Method For Extending The Field Of View For X-Ray Computed Tomography With Submicron Resolution
Authors: Zemek, Marek
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: Computed tomography allows for nondestructive evaluation of samples. It is commonly used for many industrial and scientific applications. Some devices are capable of submicron resolutions, but this often comes at the cost of a limited field of view. Techniques that extend the field of view can greatly enhance the versatility of these scanners. One such technique is presented here. It is implemented on the Rigaku Nano3DX, almost doubling its lateral field of view. The method utilizes a standard reconstruction algorithm, and yields faithful reconstructions of scanned samples without the need for a larger detector.
Keywords: computed tomography; field-of-view extension; offset scan; X-ray
Host item entry: Proceedings II of the 26st Conference STUDENT EEICT 2020: Selected papers, ISBN 978-80-214-5868-0

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/200621

Permalink: http://www.nusl.cz/ntk/nusl-447673


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