Original title: The Imaging Of A Schock Wave Within A Supersoniclow-Pressure Gas Flow Using Opticalmethods
Authors: Bayer, Robert
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: Using Environmental Scanning Electron Microscope (ESEM), which uses high gas pressure within the specimen chamber instead of vacuum, allows us to study samples containing water, samples with high capacity and live biological samples. It is because of the lack of the need to freeze the sample to sublimate the water from it. However, the behavior of the pumped gas in low pressures is not well mapped to be the low-pressure gas flow simulations considered adequately precise for applying on ESEM. To increase the precision of simulations, it is possible to use optical methods for imaging the shock wave within the differentially pumped chamber because of its uniqueness.
Keywords: ANSYS Fluent; Electron microscopy; Environmental scanning electron microscope; ESEM; Optical methods; Schlieren method; Shadowgraph; Shock wave; SolidWorks
Host item entry: Proceedings of the 23st Conference STUDENT EEICT 2017, ISBN 978-80-214-5496-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/187154

Permalink: http://www.nusl.cz/ntk/nusl-414814


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