Original title: Advanced Structural Analysis Of Silicon Solar Cells
Authors: Papež, Nikola
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure Analysis.
Keywords: defects; EBIC; optical microscopy; SEM; solar cells
Host item entry: Proceedings of the 25st Conference STUDENT EEICT 2019, ISBN 978-80-214-5735-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/186767

Permalink: http://www.nusl.cz/ntk/nusl-414669


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