Original title: Strukturní defekty v SiC detektorech
Translated title: Structure defects in SiC radiation detectors
Authors: Zetek, Matyáš ; Belas, Eduard (advisor) ; Hazdra, Pavel (referee)
Document type: Master’s theses
Year: 2019
Language: eng
Abstract: [eng] [cze]

Keywords: Annealing; Defects; Hall effect; Photoluminescence; SiC; Transient currents; defekty; Fotoluminiscence; Hallův jev; SiC; Transientní proudy; žíhání

Institution: Charles University Faculties (theses) (web)
Document availability information: Available in the Charles University Digital Repository.
Original record: http://hdl.handle.net/20.500.11956/107665

Permalink: http://www.nusl.cz/ntk/nusl-398638


The record appears in these collections:
Universities and colleges > Public universities > Charles University > Charles University Faculties (theses)
Academic theses (ETDs) > Master’s theses
 Record created 2019-07-25, last modified 2022-03-04


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