Original title: Surface profilometry by digital holography
Authors: Psota, Pavel ; Lédl, Vít ; Kaván, František ; Matoušek, O. ; Mokrý, P.
Document type: Papers
Conference/Event: 22nd IEEE International Conference on Emerging Technologies and Factory Automation, Limassol (CY), 20170912
Year: 2017
Language: eng
Abstract: This paper presents newly developed method for measurement of surface topography based on frequency scanning digital holography. Digital holography allows for direct computation of the phase field of the wavefront scattered by an object. A tuning of the light source optical frequency results in linear phase variation with respect to the optical frequency. Slope of the linear function in every single pixel corresponds to absolute measurement of optical path difference and thus topography map of the surface can be retrieved. Principle of this contactless method is introduced and experimentally verified. The method can be used for measurement of complex geometries of common manufacturing parts as well as for topography measurement of complex composite structures, and active acoustic metasurfaces.
Keywords: Absolute measurement; Digital holography; Frequency scanning; Surface profilometry
Project no.: GA16-11965S (CEP), 21176/115
Funding provider: GA ČR, Technická univerzita Liberec
Host item entry: IEEE International Conference on Emerging Technologies and Factory Automation, ISBN 978-1-5090-6505-9, ISSN 1946-0759

Institution: Institute of Plasma Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0291627

Permalink: http://www.nusl.cz/ntk/nusl-391505


The record appears in these collections:
Research > Institutes ASCR > Institute of Plasma Physics
Conference materials > Papers
 Record created 2019-02-13, last modified 2019-03-28


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